Thermal Dynamics of 7 nm FinFET Process Cascode Cross Coupled Double Tail Dynamic Comparator for Future Analog to Digital Converters

The adoption of dynamic regenerative voltage comparators is being driven by the demand for ultra-high speed, area-efficient, and extremely low-power ADCs in order to maximise power efficiency and conversion speed. In this work, thermal dynamics of a 7 nm FinFET process based cascode cross coupled double tail comparator have been investigated for future ADCs. The cascode cross coupled double tail comparator exhibited thermal-inversion effects (TIE) at 7 nm technology at all operating voltages. When the operating temperature (T) was raised from 27 to 107°C, the cross coupled double tail cascode dynamic-voltage-comparator (DVC) simulated with 0.7 V exhibited a 16.44% decrease in delay and 47.43% increase in power. When ΔVIN was elevated from 0.1 to 0.7 V at 27°C, the cross coupled double tail cascode DVC exhibited a 7.04% decrease in delay and an 11.11% decrease in power. The influence of T on the short circuit power of a 7 nm FinFET process based cascode cross coupled double tail comparator has also been investigated.