Potential of Si isotopic composition measurement for traceability of Crystalline Si wafers

Authors

Julien Barré (ORCID: https://orcid.org/0000-0002-3537-2168)
Sylvain Bérail (ORCID: https://orcid.org/0000-0002-5637-3696)
Bertrand Paviet‐Salomon (ORCID: https://orcid.org/0000-0002-8240-2673)
Christophe Pécheyran (ORCID: https://orcid.org/0000-0001-6503-4859)
Pascale Louvat (ORCID: https://orcid.org/0000-0003-1972-0633)

Institutions

Swiss Center for Electronics and Microtechnology (Switzerland) (CH)
Institut des Sciences Analytiques et de Physico-Chimie pour l'Environnement et les Matériaux (FR)

Publication Details

Published: 2025-01-01
DOI: https://doi.org/10.7185/gold2025.29208
Primary Topic: Silicon and Solar Cell Technologies
Type: article
Field-Weighted Citation Impact: 0.00

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article

Potential of Si isotopic composition measurement for traceability of Crystalline Si wafers

Julien Barré, Sylvain Bérail, Bertrand Paviet‐Salomon, Christophe Pécheyran et al.

Jan 1, 2025

Silicon and Solar Cell Technologies

article

Potential of Si isotopic composition measurement for traceability of Crystalline Si wafers

Julien Barré, Sylvain Bérail, Bertrand Paviet‐Salomon, Christophe Pécheyran, Pascale Louvat

January 1, 2025article en

Abstract

No abstract available for this paper.

Swiss Center for Electronics and Microtechnology (Switzerland) (CH), Institut des Sciences Analytiques et de Physico-Chimie pour l'Environnement et les Matériaux (FR)

Openalex Percentile: Top 70%

Silicon and Solar Cell Technologies

DOI Source OpenAlex

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