XPS and UPS investigation of beryllium in native form
There is a problem of sample composition change under the influence of ion beam. Therefore, in this article, we aim to not only supplement or refine the data (for statistical purposes) but also to provide the positions of the peaks formed by the compounds. This will contribute to a better understanding of the impact of ion beam on sample composition and aid in further analysis and interpretation of the results.
Authors
- A. Yu. Pereyaslavtsev (ORCID: https://orcid.org/0000-0001-6983-7077)
- А. В. Наумкин (ORCID: https://orcid.org/0000-0001-5696-5723)
Institutions
- A. N. Nesmeyanov Institute of Organoelement Compounds (RU)
- All Russia Research Institute of Automatics (RU)
Publication Details
- Journal
- Surface Science Spectra
- Published
- 2025-10-22
- DOI
- https://doi.org/10.1116/6.0004761
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00