XPS and UPS investigation of beryllium in native form

There is a problem of sample composition change under the influence of ion beam. Therefore, in this article, we aim to not only supplement or refine the data (for statistical purposes) but also to provide the positions of the peaks formed by the compounds. This will contribute to a better understanding of the impact of ion beam on sample composition and aid in further analysis and interpretation of the results.

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Publication Details

Journal
Surface Science Spectra
Published
2025-10-22
DOI
https://doi.org/10.1116/6.0004761
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
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article

XPS and UPS investigation of beryllium in native form

A. Yu. Pereyaslavtsev, А. В. Наумкин
Surface Science Spectra
Electron and X-Ray Spectroscopy Techniques
article

XPS and UPS investigation of beryllium in native form

A. Yu. Pereyaslavtsev, А. В. Наумкин
article en

Abstract

There is a problem of sample composition change under the influence of ion beam. Therefore, in this article, we aim to not only supplement or refine the data (for statistical purposes) but also to provide the positions of the peaks formed by the compounds. This will contribute to a better understanding of the impact of ion beam on sample composition and aid in further analysis and interpretation of the results.

Surface Science SpectraVol. 32(2)
A. N. Nesmeyanov Institute of Organoelement Compounds (RU), All Russia Research Institute of Automatics (RU)
Openalex Percentile: Top 71%
Electron and X-Ray Spectroscopy Techniques
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