X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids

We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren [B. E. Warren, Acta Crystallogr. 6, 803 (1953)]. We compare the predictions of our model with femtosecond x-ray diffraction patterns gathered from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density instrument of the European X-Ray Free-Electron Laser facility and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders.

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Publication Details

Journal
Journal of Applied Physics
Published
2025-10-21
DOI
https://doi.org/10.1063/5.0295250
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
0.00

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article

X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids

C. A. Bolme, Jan‐Patrick Schwinkendorf, Cristina Hernandez–Gomez, Cara E. Vennari et al.
Journal of Applied Physics
X-ray Diffraction in Crystallography
article

X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids

C. A. Bolme, Jan‐Patrick Schwinkendorf, Cristina Hernandez–Gomez, Cara E. Vennari, A. Pelka, T. M. Hutchinson, N. J. Hartley, T.E. Stevens, A.-M. Norton, P. Koester, G. Collins, M.G. Stevenson, S. J. Tracy, D. McGonegle, Saransh Singh, Orianna B. Ball, Jan Vorberger, A. J. Comley, Minxue Tang, T. Toncian, Hélène Ginestet, S. Di Dio Cafiso, Zuzana Konôpková, Alejandro Laso García, B. Albertazzi, Amy Lazicki, Hauke Höppner, A. B. Belonoshko, Michael R. Armstrong, G. Morard, M. Nakatsutsumi, Khachiwan Buakor, A. L. Coleman, Chris Edwards, T. Tschentscher, Anand Dwivedi, C. Strohm, M. I. McMahon, Sébastien Merkel, A. E. Gleason, Travis J. Volz, Bernhard Massani, Thomas R. Preston, Norimasa Ozaki, Karen Appel, J. S. Wark, C. Spindloe, Rachel J. Husband, A. Sollier, R. Briggs, Adrien Descamps, A. Trapananti, David Santamarı́a-Pérez, Lisa Randolph, David A. Keen, Daniel Errandonea, Sebastian Goede, Kien Nguyen-Cong, Eric Galtier, Clemens Prescher, Carsten Baehtz, Silvia Pandolfi, F. Coppari, R. F. Smith, L. Labate, Oliver Humphries, K. A. Pereira, Bob Nagler, T. E. Cowan, D. Kraus, Terry‐Ann Suer, Andrea Di Cicco, M. J. Duff, Julien Chantel, Ivan Oleynik, L. A. Gizzi, Hyunchae Cynn, Béatrice Perez, J. H. Eggert, Hanns‐Peter Liermann, V. Bouffetier, Thomas Butcher, M. Schoelmerich, L. Wollenweber, E. Brambrink, A. Ravasio, Paul Mason, C. P. McGuire, R. S. McWilliams, J. McHardy, G. Cristoforetti, P. G. Heighway, Christoph Otzen, U. Zastrau, Jaeyong Kim, T. Vinci, M. Toncian, E. E. McBride, S. J. Ali, L. Antonelli, Sven C. Vogel, M. G. Gorman, D. J. Peake, Daniel J. Savage, Valerio Cerantola, M. Harmand, A. Krygier, Saumyabrata Banerjee, J. Rips, Yongjae Lee, Joseph M. Gonzalez, Huijeong Hwang, J. M. Smith, M. Masruri, F. Dorchies, D. Ranjan, Andrew Higginbotham, Jonathan Phillips, J. Collier, Jonathan T. Willman, Mike Tyldesley, J. Spear
article en

Abstract

We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren [B. E. Warren, Acta Crystallogr. 6, 803 (1953)]. We compare the predictions of our model with femtosecond x-ray diffraction patterns gathered from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density instrument of the European X-Ray Free-Electron Laser facility and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders.

Journal of Applied PhysicsVol. 138(15)
Università di Camerino (IT), Queen's University Belfast (GB), Lawrence Livermore National Laboratory (US), Rutherford Appleton Laboratory (GB), Centre National de la Recherche Scientifique (FR), Los Alamos National Laboratory (US), École Polytechnique (FR), Université de Bordeaux (FR), Universitat de València (ES), University of Freiburg (DE), Institute of Technology of Cambodia (KH), Arts et Métiers (FR), Yonsei University (KR), Carnegie Institution for Science (US), University of Massachusetts Amherst (US), University of South Florida (US), Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR), Université Paris-Saclay (FR), Helmholtz-Zentrum Dresden-Rossendorf (DE), Deutsches Elektronen-Synchrotron DESY (DE), SLAC National Accelerator Laboratory (US), AWE Nuclear Security Technologies (GB), Paul Scherrer Institute (CH), Sorbonne Université (FR), University of Oxford (GB), Laboratoire pour l'Utilisation des Lasers Intenses (FR), Research Complex at Harwell (GB), Menlo School (US), CEA DAM Île-de-France (FR), Toneyama National Hospital (JP), Institut des Sciences de la Terre (FR), Energetics (United States) (US), Centre Lasers Intenses et Applications (FR), National Institute of Optics (IT), CEA Paris-Saclay (FR), HESAM Université (FR), Unité Matériaux et Transformations (FR), Institut de minéralogie, de physique des matériaux et de cosmochimie (FR), Université Gustave Eiffel (FR), Yonsei University Health System (KR), Institut de Recherche pour le Développement (FR), Earth and Planets Laboratory, Hanyang University (KR), University of Rostock (DE), University of York (GB), University of Rochester (US), University of Milano-Bicocca (IT), Université Savoie Mont Blanc (FR), Nanjing University (CN), Université Grenoble Alpes (FR), European X-Ray Free-Electron Laser (DE), The University of Osaka (JP), University of Edinburgh (GB)
National Science Foundation, U.S. Department of Energy, National Aeronautics and Space Administration, University of Rochester, European Commission, Deutsche Forschungsgemeinschaft, Generalitat Valenciana, Centre National de la Recherche Scientifique, Ministerio de Ciencia e Innovación, Ministry of Science and ICT, South Korea, Office of Science, National Nuclear Security Administration, Engineering and Physical Sciences Research Council, Science and Technology Facilities Council, Deutsches Elektronen-Synchrotron, Agencia Estatal de Investigación, Lawrence Livermore National Laboratory, Los Alamos National Laboratory, SLAC National Accelerator Laboratory
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X-ray Diffraction in Crystallography
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