Observation of microscopic damage in nanomaterials using laser-accelerated proton beams
Owing to their broad energy spectrum, short pulse width, and high particle numbers, laser-accelerated protons offer significant advantages for rapidly evaluating the durability of materials and understanding microscopic damage mechanisms. In this study, WO3 nanowires were synthesized to assess their resistance when exposed to irradiation from laser-accelerated proton beams. Unlike traditional bulk materials, the surface of WO3 nanowires showed no apparent damage after irradiation; however, advanced characterization techniques reveal a unique surface-to-core amorphization damage phenomenon in nanowires. Comparative experiments with a traditional accelerator (nine orders lower dose rate) confirm that ultrashort pulses are indispensable for triggering this amorphization. Our findings establish WO3 nanowires as promising radiation-resistant candidates and provide insight into how the microscopic damage process varies with the dosage of laser-driven protons.
Authors
- Yang Yan (ORCID: https://orcid.org/0000-0002-2603-2858)
- Qinghao Zhang (ORCID: https://orcid.org/0000-0001-8175-4266)
- Shenghua Ye (ORCID: https://orcid.org/0009-0005-3297-674X)
- Chen Lin (ORCID: https://orcid.org/0000-0001-9049-3002)
- Yulong Fang (ORCID: https://orcid.org/0000-0002-5974-5010)
- Chentong Li (ORCID: https://orcid.org/0000-0002-5027-6203)
- Mingfeng Huang (ORCID: https://orcid.org/0009-0002-8956-0313)
- Xueqing Yan (ORCID: https://orcid.org/0000-0002-2437-6577)
- Qianling Zhang (ORCID: https://orcid.org/0000-0001-6942-3958)
- Yiting Yan (ORCID: https://orcid.org/0009-0004-4549-3782)
Institutions
- Shenzhen University (CN)
- Peking University (CN)
- Plasma Technology (United States) (US)
- Beijing Advanced Sciences and Innovation Center (CN)
Publication Details
- Journal
- Applied Physics Letters
- Published
- 2025-10-20
- DOI
- https://doi.org/10.1063/5.0281303
- Primary Topic
- Laser-Plasma Interactions and Diagnostics
- Type
- article
- Field-Weighted Citation Impact
- 0.00