Revealing anisotropic lithiation control in silicon nanowires <i>via</i> a novel <i>in situ</i> TEM-based cross-sectional characterization method

Silicon nanowires (Si NWs) hold great promise as high-capacity anode materials for next-generation batteries. However, their application is severely hindered by anisotropic lithiation, which leads to structural failure and rapid capacity fading. Here, we introduce a novel <i>in situ</i> transmission electron microscopy (TEM) cross-sectional analysis technique that enables real-time visualization and quantitative analysis of the radial structural evolution of one-dimensional (1D) nanomaterials under external stimuli. Applying this method to Si NWs, we uncover a two-tiered mechanism for regulating anisotropic lithiation in Si NWs. First, selecting axial orientations with high in-plane crystallographic symmetry can effectively facilitate uniform lithium (Li) diffusion and suppress directional expansion. Second, rational cross-sectional design, such as faceted-engineered geometries, further suppresses anisotropy by constraining the effective interfacial area and diffusion path length in fast-lithiation directions. These findings provide new insights into the control of anisotropic lithiation and offer a geometry-guided strategy for enhancing the structural stability and performance of Si-based anodes. Moreover, the methodology and anisotropy regulation principles established here are broadly applicable to other 1D nanomaterials.

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Publication Details

Journal
Nanoscale Horizons
Published
2025-10-21
DOI
https://doi.org/10.1039/d5nh00486a
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
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article

Revealing anisotropic lithiation control in silicon nanowires via a novel in situ TEM-based cross-sectional characterization method

Kailin Luo, Litao Sun, Qiuyang Tan, Sijing Chen et al.
Nanoscale Horizons
Semiconductor materials and devices
article

Revealing anisotropic lithiation control in silicon nanowires via a novel in situ TEM-based cross-sectional characterization method

Kailin Luo, Litao Sun, Qiuyang Tan, Sijing Chen, Hai Li, Li Zhong
article en

Abstract

Silicon nanowires (Si NWs) hold great promise as high-capacity anode materials for next-generation batteries. However, their application is severely hindered by anisotropic lithiation, which leads to structural failure and rapid capacity fading. Here, we introduce a novel <i>in situ</i> transmission electron microscopy (TEM) cross-sectional analysis technique that enables real-time visualization and quantitative analysis of the radial structural evolution of one-dimensional (1D) nanomaterials under external stimuli. Applying this method to Si NWs, we uncover a two-tiered mechanism for regulating anisotropic lithiation in Si NWs. First, selecting axial orientations with high in-plane crystallographic symmetry can effectively facilitate uniform lithium (Li) diffusion and suppress directional expansion. Second, rational cross-sectional design, such as faceted-engineered geometries, further suppresses anisotropy by constraining the effective interfacial area and diffusion path length in fast-lithiation directions. These findings provide new insights into the control of anisotropic lithiation and offer a geometry-guided strategy for enhancing the structural stability and performance of Si-based anodes. Moreover, the methodology and anisotropy regulation principles established here are broadly applicable to other 1D nanomaterials.

Nanoscale HorizonsVol. 11(1)
Ministry of Education (BD), Southeast University (CN)
Openalex Percentile: Top 70%
Semiconductor materials and devices
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Revealing anisotropic lithiation control in silicon nanowires <i>via</i> a novel <i>in situ</i> TEM-based cross-sectional characterization method — Kailin Luo, Litao Sun, et al. · Nanoscale Horizons (2025) | TGRS Research Map | TGRS