Tri-layered XBAR with SiO2 middle layer
XBARs enable the design of low-loss 5 GHz filters that meet the n79 Specification. Meanwhile, the device is fragile, and designers fight to achieve the desired power-handling levels. The temperature shifts of lithium niobate are high. Recently proposed periodically poled structures enhance device robustness and increase the relative passband width; however, they also inherit other drawbacks mentioned. Here, we propose a tri-layered XBAR structure with SiO2 as the middle layer, which is robust, has significantly better TCF, and is supposed to improve power handling capability radically.
Authors
- Luis Guillermo Villanueva (ORCID: https://orcid.org/0000-0003-3340-2930)
- V.P. Plessky
- Seniz Esra Küçük
- Naiqing Zhang (ORCID: https://orcid.org/0000-0002-0394-9161)
Institutions
- Huawei Technologies (China) (CN)
- Huawei Technologies (United States) (US)
- École Polytechnique Fédérale de Lausanne (CH)
Publication Details
- Published
- 2025-09-15
- DOI
- https://doi.org/10.1109/ius62464.2025.11201589
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00