Tri-layered XBAR with SiO2 middle layer

XBARs enable the design of low-loss 5 GHz filters that meet the n79 Specification. Meanwhile, the device is fragile, and designers fight to achieve the desired power-handling levels. The temperature shifts of lithium niobate are high. Recently proposed periodically poled structures enhance device robustness and increase the relative passband width; however, they also inherit other drawbacks mentioned. Here, we propose a tri-layered XBAR structure with SiO2 as the middle layer, which is robust, has significantly better TCF, and is supposed to improve power handling capability radically.

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Publication Details

Published
2025-09-15
DOI
https://doi.org/10.1109/ius62464.2025.11201589
Primary Topic
Advanced Semiconductor Detectors and Materials
Type
article
Field-Weighted Citation Impact
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article

Tri-layered XBAR with SiO2 middle layer

Luis Guillermo Villanueva, V.P. Plessky, Seniz Esra Küçük, Naiqing Zhang
Advanced Semiconductor Detectors and Materials
article

Tri-layered XBAR with SiO2 middle layer

Luis Guillermo Villanueva, V.P. Plessky, Seniz Esra Küçük, Naiqing Zhang
article en

Abstract

XBARs enable the design of low-loss 5 GHz filters that meet the n79 Specification. Meanwhile, the device is fragile, and designers fight to achieve the desired power-handling levels. The temperature shifts of lithium niobate are high. Recently proposed periodically poled structures enhance device robustness and increase the relative passband width; however, they also inherit other drawbacks mentioned. Here, we propose a tri-layered XBAR structure with SiO2 as the middle layer, which is robust, has significantly better TCF, and is supposed to improve power handling capability radically.

Huawei Technologies (China) (CN), Huawei Technologies (United States) (US), École Polytechnique Fédérale de Lausanne (CH)
Openalex Percentile: Top 70%
Advanced Semiconductor Detectors and Materials
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