Methodology for determining and controlling the load capacity of integrated circuits

Background. The relevance of the topic of this work is due to the need to increase the reliability of the quality of determination and control of the load capacity of microcircuits. Aim. Improving the accuracy and expanding the control functions in determining the load capacity of the microcircuits. Methods. The article considers a variant of the diagnostic non-destructive testing of microcircuits. It includes a model, a control device and an algorithm for its functioning. A well-known model was used, which was adapted to specific development and research tasks. The proposed technique makes it possible to find the largest number of inputs of logic elements that can be connected to the output of the tested microcircuits without deterioration of its functional parameters. The device included in the methodology can be used both independently and in the system of the measuring complex in conjunction with other equipment. Operation in three main modes is provided by programming the microcontroller. The program was written in C++. The proposed algorithm ensures the operation of the control device in dichotony modes, sequential and manual. Performs the functions of selecting the initial and maximum values of load elements, the signal level by which the load capacity is determined. Results. The values of the load capacity for three types of chips are obtained. The indicators of control accuracy and reliability have been determined. Using the element base of Microchip and MAXIM companies allowed for a 30% increase in measurement accuracy. Based on the conducted research tests and mock-up of the device, the capabilities of the device in various operating modes are evaluated. Conclusion. Testing of the technique on a number of samples showed its high efficiency. After finalizing the design of the device, instructions for its operation were prepared.