Development and Characterization of Advanced Mutants of Mungbean for Yield-Contributing Traits

This study aims to characterize sixteen advanced mungbean mutants (M4 generation), developed through ethyl methanesulfonate and gamma radiation, for yield-related traits and biometrical analyses of the traits for efficient selection. The experiment was conducted employing a randomized complete block design. Data on ten key traits [days to first flowering (DFF), days to first harvest (DFH), days to last harvest (DLH), plant height (PH), number of branches per plant (NBP), number of pods per plant (NPP), pod length (PL), number of seeds per pod (NSP), 100-seed weight (100-SW), and yield per plant (YPP)] were recorded. Significant variability among genotypes was observed for all traits. Higher YPP was recorded in the mutants DEMS22 (28.55 g), DGR41 (24.14 g), BEMS62 (23.5 g), DGR51 (23.35 g), DEMS61 (23.3 g), and BEMS61 (23.15 g). High heritability and high genetic advance (%) was observed for YPP (97% and 54.23%, respectively), NPP (97% and 52.42%, respectively), NBP (90% and 42.06%, respectively), PH (97% and 36.51%, respectively), 100-SW (93% and 34.76%, respectively), and NSP (95% and 27.5%, respectively). YPP showed significant positive correlation with DLH, and NPP. Path analysis identified DLH, NSP, and NPP as the primary direct contributors to yield. Principal component analysis (PCA) indicated that the first three PC explained 79.32% of the total variation, with DLH, NPP, PL, 100-SW, and YPP showed significant contributors to divergence. Cluster analysis categorized the genotypes into four distinct clusters where cluster III identified as the most promising. Therefore, the identified promising mutants can be used for developing high-yielding varieties.