Efficient Sampling and Sensitivity Analysis of Rare Transient Instability Events via Subset Simulation

Assessing the risk of low-probability high-impact transient instability (TI) events is crucial for ensuring robust and stable power system operation under high uncertainty. However, direct Monte Carlo (DMC) simulation for rare TI event sampling is computationally intensive. This paper proposes a subset simulation-based method for efficient small TI probability estimation, rare TI events sampling, and subsequent sensitivity analysis. Numerical studies on the modified WSCC 9-bus system demonstrate the efficiency of the proposed method over DMC. Additionally, targeted stability enhancement strategies are designed to eliminate rare TI events and enhance the system's robustness to specific transient faults.

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Publication Details

Journal
ArXiv.org
Published
2025-03-04
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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article

Efficient Sampling and Sensitivity Analysis of Rare Transient Instability Events via Subset Simulation

Xiaozhe Wang, Jingyu Liu, Xiaoting Wang
ArXiv.org
Integrated Circuits and Semiconductor Failure Analysis
article

Efficient Sampling and Sensitivity Analysis of Rare Transient Instability Events via Subset Simulation

Xiaozhe Wang, Jingyu Liu, Xiaoting Wang
article en

Abstract

Assessing the risk of low-probability high-impact transient instability (TI) events is crucial for ensuring robust and stable power system operation under high uncertainty. However, direct Monte Carlo (DMC) simulation for rare TI event sampling is computationally intensive. This paper proposes a subset simulation-based method for efficient small TI probability estimation, rare TI events sampling, and subsequent sensitivity analysis. Numerical studies on the modified WSCC 9-bus system demonstrate the efficiency of the proposed method over DMC. Additionally, targeted stability enhancement strategies are designed to eliminate rare TI events and enhance the system's robustness to specific transient faults.

ArXiv.org
Openalex Percentile: Top 70%
Integrated Circuits and Semiconductor Failure Analysis
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