A Semi-Supervised Learning Method for the Identification of Bad Exposures in Large Imaging Surveys

As the data volume of astronomical imaging surveys rapidly increases, traditional methods for image anomaly detection, such as visual inspection by human experts, are becoming impractical. We introduce a machine-learning-based approach to detect poor-quality exposures in large imaging surveys, with a focus on the DECam Legacy Survey (DECaLS) in regions of low extinction (i.e., <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mrow> <mml:mi>E</mml:mi> <mml:mrow> <mml:mo stretchy="true" form="prefix">(</mml:mo> <mml:mi>B</mml:mi> <mml:mo>−</mml:mo> <mml:mi>V</mml:mi> <mml:mo stretchy="true" form="postfix">)</mml:mo> </mml:mrow> <mml:mo>&lt;</mml:mo> <mml:mn>0.04</mml:mn> </mml:mrow> </mml:math> ). Our semi-supervised pipeline integrates a vision transformer (ViT), trained via self-supervised learning (SSL), with a k-Nearest Neighbor (kNN) classifier. We train and validate our pipeline using a small set of labeled exposures observed by surveys with the Dark Energy Camera (DECam). A clustering-space analysis of where our pipeline places images labeled in good and bad categories suggests that our approach can efficiently and accurately determine the quality of exposures. Applied to new imaging being reduced for DECaLS Data Release 11, our pipeline identifies 780 problematic exposures, which we subsequently verify through visual inspection. Being highly efficient and adaptable, our method offers a scalable solution for quality control in other large imaging surveys.

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Publication Details

Journal
The Open Journal of Astrophysics
Published
2026-02-27
DOI
https://doi.org/10.33232/001c.158430
Primary Topic
Advanced X-ray and CT Imaging
Type
article
Field-Weighted Citation Impact
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article

A Semi-Supervised Learning Method for the Identification of Bad Exposures in Large Imaging Surveys

Rongpu Zhou, Darío Demattíes, Yufeng Luo, F. Valdés et al.
The Open Journal of Astrophysics
Advanced X-ray and CT Imaging
article

A Semi-Supervised Learning Method for the Identification of Bad Exposures in Large Imaging Surveys

Rongpu Zhou, Darío Demattíes, Yufeng Luo, F. Valdés, David J. Schlegel, Desi Legacy Imaging Surveys Team, A. Drlica-Wagner, Adam D. Myers, Arjun Dey, Salma Borchani
article en

Abstract

As the data volume of astronomical imaging surveys rapidly increases, traditional methods for image anomaly detection, such as visual inspection by human experts, are becoming impractical. We introduce a machine-learning-based approach to detect poor-quality exposures in large imaging surveys, with a focus on the DECam Legacy Survey (DECaLS) in regions of low extinction (i.e., <mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" display="inline"> <mml:mrow> <mml:mi>E</mml:mi> <mml:mrow> <mml:mo stretchy="true" form="prefix">(</mml:mo> <mml:mi>B</mml:mi> <mml:mo>−</mml:mo> <mml:mi>V</mml:mi> <mml:mo stretchy="true" form="postfix">)</mml:mo> </mml:mrow> <mml:mo>&lt;</mml:mo> <mml:mn>0.04</mml:mn> </mml:mrow> </mml:math> ). Our semi-supervised pipeline integrates a vision transformer (ViT), trained via self-supervised learning (SSL), with a k-Nearest Neighbor (kNN) classifier. We train and validate our pipeline using a small set of labeled exposures observed by surveys with the Dark Energy Camera (DECam). A clustering-space analysis of where our pipeline places images labeled in good and bad categories suggests that our approach can efficiently and accurately determine the quality of exposures. Applied to new imaging being reduced for DECaLS Data Release 11, our pipeline identifies 780 problematic exposures, which we subsequently verify through visual inspection. Being highly efficient and adaptable, our method offers a scalable solution for quality control in other large imaging surveys.

The Open Journal of AstrophysicsVol. 9
ORCID (US)
Openalex Percentile: Top 100%
Advanced X-ray and CT Imaging
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