Deep-reactive-ion-etching in X-ray grating fabrication: a review
The development of grating fabrication shares its journey with the development of X-ray phase contrast imaging. Indeed, the fabrication of gratings with features of sufficiently high aspect ratio is one of the bottlenecks preventing the widespread application of phase contrast imaging in X-ray diagnostics, material science and security. The silicon platform that underlies modern manufacture of integrated circuits, with its well-established technologies for lithography, etching and metal deposition, has the potential to provide high yields and volumes for industrial fabrication of both phase and absorption gratings used in a grating-based X-ray imaging systems. This review article introduces recent developments in the fabrication of high aspect ratio X-ray gratings using ubiquitous clean-room manufacturing tools, focusing on deep reactive ion etching processes. It summarizes the most challenging issues for fabricating features with aspect ratios reaching 70:1, proposing approaches to overcome processing problems and improve product quality.
Authors
- Marco Stampanoni (ORCID: https://orcid.org/0000-0001-7486-6681)
- Alexandre Pereira
- Lucia Romano (ORCID: https://orcid.org/0000-0002-7696-7643)
- Konstantins Jefimovs (ORCID: https://orcid.org/0000-0002-1888-0777)
- D. Josell (ORCID: https://orcid.org/0000-0002-4273-1923)
- Zhitian Shi (ORCID: https://orcid.org/0000-0003-0539-219X)
- Joan Vila‐Comamala (ORCID: https://orcid.org/0000-0002-1543-3146)
Institutions
- National Institute of Standards and Technology (US)
- Brookhaven National Laboratory (US)
- University of Cambridge (GB)
- Paul Scherrer Institute (CH)
- Institute for Biomedical Engineering (CH)
- Nanomaterials Research (United States) (US)
Publication Details
- Journal
- Materials Science in Semiconductor Processing
- Published
- 2025-09-16
- DOI
- https://doi.org/10.1016/j.mssp.2025.110041
- Citations
- 3
- Primary Topic
- Advanced Surface Polishing Techniques
- Type
- article
- Field-Weighted Citation Impact
- 2.02