APT Calibrator: A Multifunctional C# Software Application for Reconstruction Calibration in Atom Probe Tomography

Atom probe tomography provides compositional mapping of materials at the nanoscale, and in that sense accurate reconstruction of the atomic positions is crucial for precise and accurate analysis. Here, we introduce the "APT Calibrator," developed in C#, a software tool that aids in the calibration of atom probe tomography reconstructions. It integrates essential calibration methods proposed over the past two decades to derive the key hyperparameters, such as the image compression factor and field reduction factor, allows for dynamic reconstruction of the data using a newly introduced method based on the use of fiducial markers that we refer to as "golden seed," and facilitates atom probe crystallographic analysis of microstructural defects. The software features a straightforward interface, simplifying the calibration process and making it more accessible.

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Publication Details

Journal
Microscopy and Microanalysis
Published
2025-09-03
DOI
https://doi.org/10.1093/mam/ozaf092
Primary Topic
Advanced Materials Characterization Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

APT Calibrator: A Multifunctional C# Software Application for Reconstruction Calibration in Atom Probe Tomography

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Microscopy and Microanalysis
Advanced Materials Characterization Techniques
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APT Calibrator: A Multifunctional C# Software Application for Reconstruction Calibration in Atom Probe Tomography

Xinren Chen, Xuyang Zhou, Eric Woods, Baptiste Gault, Yue Li
article en

Abstract

Atom probe tomography provides compositional mapping of materials at the nanoscale, and in that sense accurate reconstruction of the atomic positions is crucial for precise and accurate analysis. Here, we introduce the "APT Calibrator," developed in C#, a software tool that aids in the calibration of atom probe tomography reconstructions. It integrates essential calibration methods proposed over the past two decades to derive the key hyperparameters, such as the image compression factor and field reduction factor, allows for dynamic reconstruction of the data using a newly introduced method based on the use of fiducial markers that we refer to as "golden seed," and facilitates atom probe crystallographic analysis of microstructural defects. The software features a straightforward interface, simplifying the calibration process and making it more accessible.

Microscopy and MicroanalysisVol. 31(5)
Max-Planck-Institut für Nachhaltige Materialien (DE), Imperial College London (GB)
Deutsche Forschungsgemeinschaft, Technische Universität Darmstadt
Openalex Percentile: Top 72%
Advanced Materials Characterization Techniques
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