ImbDef-GAN: Defect Image-Generation Method Based on Sample Imbalance

In industrial settings, defect detection using deep learning typically requires large numbers of defective samples. However, defective products are rare on production lines, creating a scarcity of defect samples and an overabundance of samples that contain only background. We introduce ImbDef-GAN, a sample imbalance generative framework, to address three persistent limitations in defect image generation: unnatural transitions at defect background boundaries, misalignment between defects and their masks, and out-of-bounds defect placement. The framework operates in two stages: (i) background image generation and (ii) defect image generation conditioned on the generated background. In the background image-generation stage, a lightweight StyleGAN3 variant jointly generates the background image and its segmentation mask. A Progress-coupled Gated Detail Injection module uses global scheduling driven by training progress and per-pixel gating to inject high-frequency information in a controlled manner, thereby enhancing background detail while preserving training stability. In the defect image-generation stage, the design augments the background generator with a residual branch that extracts defect features. By blending defect features with a smoothing coefficient, the resulting defect boundaries transition more naturally and gradually. A mask-aware matching discriminator enforces consistency between each defect image and its mask. In addition, an Edge Structure Loss and a Region Consistency Loss strengthen morphological fidelity and spatial constraints within the valid mask region. Extensive experiments on the MVTec AD dataset demonstrate that ImbDef-GAN surpasses existing methods in both the realism and diversity of generated defects. When the generated data are used to train a downstream detector, YOLOv11 achieves a 5.4% improvement in [email protected], indicating that the proposed approach effectively improves detection accuracy under sample imbalance.

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Publication Details

Journal
Journal of Imaging
Published
2025-10-16
DOI
https://doi.org/10.3390/jimaging11100367
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
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article

ImbDef-GAN: Defect Image-Generation Method Based on Sample Imbalance

Dengbiao Jiang, Haijian Shao, Yiming Wang, Nian Tao et al.
Journal of Imaging
Industrial Vision Systems and Defect Detection
article

ImbDef-GAN: Defect Image-Generation Method Based on Sample Imbalance

Dengbiao Jiang, Haijian Shao, Yiming Wang, Nian Tao, K. J. Zhu
article en

Abstract

In industrial settings, defect detection using deep learning typically requires large numbers of defective samples. However, defective products are rare on production lines, creating a scarcity of defect samples and an overabundance of samples that contain only background. We introduce ImbDef-GAN, a sample imbalance generative framework, to address three persistent limitations in defect image generation: unnatural transitions at defect background boundaries, misalignment between defects and their masks, and out-of-bounds defect placement. The framework operates in two stages: (i) background image generation and (ii) defect image generation conditioned on the generated background. In the background image-generation stage, a lightweight StyleGAN3 variant jointly generates the background image and its segmentation mask. A Progress-coupled Gated Detail Injection module uses global scheduling driven by training progress and per-pixel gating to inject high-frequency information in a controlled manner, thereby enhancing background detail while preserving training stability. In the defect image-generation stage, the design augments the background generator with a residual branch that extracts defect features. By blending defect features with a smoothing coefficient, the resulting defect boundaries transition more naturally and gradually. A mask-aware matching discriminator enforces consistency between each defect image and its mask. In addition, an Edge Structure Loss and a Region Consistency Loss strengthen morphological fidelity and spatial constraints within the valid mask region. Extensive experiments on the MVTec AD dataset demonstrate that ImbDef-GAN surpasses existing methods in both the realism and diversity of generated defects. When the generated data are used to train a downstream detector, YOLOv11 achieves a 5.4% improvement in [email protected], indicating that the proposed approach effectively improves detection accuracy under sample imbalance.

Journal of ImagingVol. 11(10)
Jiangsu University of Science and Technology (CN), Shanghai Construction Group (China) (CN)
Openalex Percentile: Top 58%
Industrial Vision Systems and Defect Detection
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