Recent insights in direct extraction of access resistance components in NSFET and CFET devices with the cascaded transistor method

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Publication Details

Published
2025-09-16
DOI
https://doi.org/10.7567/ssdm.2025.a-1-03
Citations
2
Primary Topic
Advancements in Semiconductor Devices and Circuit Design
Type
article
Field-Weighted Citation Impact
1.46
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article

Recent insights in direct extraction of access resistance components in NSFET and CFET devices with the cascaded transistor method

Pierre Eyben, Hiroaki Arimura, Clément Porret, Hans Mertens et al.
2 citations
Advancements in Semiconductor Devices and Circuit Design
1.46
article

Recent insights in direct extraction of access resistance components in NSFET and CFET devices with the cascaded transistor method

Pierre Eyben, Hiroaki Arimura, Clément Porret, Hans Mertens, Erik Rosseel, Ritam Sarkar, Naoto Horiguchi, T. Chiarella, Daisy Zhou, Maryam Hosseini, Jérôme Mitard, Andrea Pondini
article en
2 citations

Abstract

No abstract available for this paper.
Openalex Percentile: Top 15%
Advancements in Semiconductor Devices and Circuit Design
1.46
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