Performance Improvement of Polarization Image Sensor with Multilayer On-Pixel Polarizer Structure for High-Sensitivity Millimeter-Wave Electro-Optic Imaging
In this paper, we demonstrated a high-sensitivity polarization image sensor for millimeter-wave electric field imaging using electro-optic crystals. We developed a three-layer on-pixel polarizer structure fabricated with a 0.35-µm standard CMOS process, achieving an extinction ratio of 5.7, which corresponds to a 73% improvement over previous two-layer structure. Crosstalk reduction was implemented by applying a bias voltage to the n-well pixel separation, and extinction ratio was further improved. By using an improved sensor, it demonstrated a 7.6 dB SNR improvement in 30 GHz electric field imaging compared to previous sensors, despite 30% transmittance reduction. Angular dependence analysis confirmed adequate performance within the optical system’s constraints. These results enable high-speed and high-sensitivity millimeter-wave imaging applications.
Authors
- Jun Ohta (ORCID: https://orcid.org/0000-0001-8194-9020)
- Kiyotaka Sasagawa (ORCID: https://orcid.org/0000-0002-5718-3958)
- Makito Haruta (ORCID: https://orcid.org/0000-0002-7155-9018)
- Hiroyuki Tashiro (ORCID: https://orcid.org/0000-0001-5669-154X)
- Hironari Takehara (ORCID: https://orcid.org/0000-0001-7689-1186)
- Ryoma Okada (ORCID: https://orcid.org/0000-0002-3496-919X)
- Maya Mizuno (ORCID: https://orcid.org/0009-0003-0343-3055)
Institutions
- Chitose Institute of Science and Technology (JP)
- Kyushu University (JP)
- Nara Institute of Science and Technology (JP)
- National Institute of Information and Communications Technology (JP)
Publication Details
- Journal
- Electronics
- Published
- 2025-10-14
- DOI
- https://doi.org/10.3390/electronics14204026
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Tateisi Science and Technology Foundation
- Ministry of Internal Affairs and Communications