Performance Improvement of Polarization Image Sensor with Multilayer On-Pixel Polarizer Structure for High-Sensitivity Millimeter-Wave Electro-Optic Imaging

In this paper, we demonstrated a high-sensitivity polarization image sensor for millimeter-wave electric field imaging using electro-optic crystals. We developed a three-layer on-pixel polarizer structure fabricated with a 0.35-µm standard CMOS process, achieving an extinction ratio of 5.7, which corresponds to a 73% improvement over previous two-layer structure. Crosstalk reduction was implemented by applying a bias voltage to the n-well pixel separation, and extinction ratio was further improved. By using an improved sensor, it demonstrated a 7.6 dB SNR improvement in 30 GHz electric field imaging compared to previous sensors, despite 30% transmittance reduction. Angular dependence analysis confirmed adequate performance within the optical system’s constraints. These results enable high-speed and high-sensitivity millimeter-wave imaging applications.

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Publication Details

Journal
Electronics
Published
2025-10-14
DOI
https://doi.org/10.3390/electronics14204026
Primary Topic
Photonic and Optical Devices
Type
article
Field-Weighted Citation Impact
0.00

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article

Performance Improvement of Polarization Image Sensor with Multilayer On-Pixel Polarizer Structure for High-Sensitivity Millimeter-Wave Electro-Optic Imaging

Jun Ohta, Kiyotaka Sasagawa, Makito Haruta, Hiroyuki Tashiro et al.
Electronics
Photonic and Optical Devices
article

Performance Improvement of Polarization Image Sensor with Multilayer On-Pixel Polarizer Structure for High-Sensitivity Millimeter-Wave Electro-Optic Imaging

Jun Ohta, Kiyotaka Sasagawa, Makito Haruta, Hiroyuki Tashiro, Hironari Takehara, Ryoma Okada, Maya Mizuno
article en

Abstract

In this paper, we demonstrated a high-sensitivity polarization image sensor for millimeter-wave electric field imaging using electro-optic crystals. We developed a three-layer on-pixel polarizer structure fabricated with a 0.35-µm standard CMOS process, achieving an extinction ratio of 5.7, which corresponds to a 73% improvement over previous two-layer structure. Crosstalk reduction was implemented by applying a bias voltage to the n-well pixel separation, and extinction ratio was further improved. By using an improved sensor, it demonstrated a 7.6 dB SNR improvement in 30 GHz electric field imaging compared to previous sensors, despite 30% transmittance reduction. Angular dependence analysis confirmed adequate performance within the optical system’s constraints. These results enable high-speed and high-sensitivity millimeter-wave imaging applications.

ElectronicsVol. 14(20)
Chitose Institute of Science and Technology (JP), Kyushu University (JP), Nara Institute of Science and Technology (JP), National Institute of Information and Communications Technology (JP)
Tateisi Science and Technology Foundation, Ministry of Internal Affairs and Communications
Openalex Percentile: Top 71%
Photonic and Optical Devices
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