Molecular Electronics Meets Direct-Write Carbon Nanofabrication via Focused Electron-Beam-Induced Deposition (FEBID): A Platform for Junction Architecture Design

The electrical characteristics of a molecular junction are highly sensitive to the nature and uniformity of the molecule|electrode contacts. This gives rise to significant interest in the development of not only the active molecular structures that modulate charge transport and the anchor groups that contact them to the electrodes, but also methods for assembling uniform molecular monolayers on a substrate electrode and subsequent fabrication of a "top electrode" to achieve the reliable fabrication of viable molecular electronic devices. In this contribution, 4-(4-(4-(trimethylsilylethynyl)-phenylethynyl)-phenylethynyl)-aniline was converted to the corresponding diazonium salt and electrografted onto highly oriented pyrolytic graphite (HOPG), resulting in an organized monolayer covalently bonded to the HOPG "substrate" electrode. Subsequently, focused electron-beam-induced deposition was used to form an amorphous carbon top electrode (C-FEBID) onto the monolayer from a naphthalene precursor. By guiding the raster scanning of the electron beam, the position, shape, and thickness of the carbon electrode "written" onto the monolayer can be controlled with nanometer precision. In addition, as a proof-of-principle demonstration of the construction of the interconnects necessary for integration of molecular devices, platinum was deposited precisely on top of the C-FEBID electrodes, using focused-ion-beam-induced deposition of PtMe<sub>3</sub>Cp<sup>Me</sup> (Cp<sup>Me</sup> = η<sup>5</sup>-C<sub>5</sub>H<sub>4</sub>Me) (Pt-FIBID). The HOPG|molecule|C-FEBID|Pt-FIBID "large area" junctions produced in this manner exhibited excellent reproducibility and were free of short circuits for top-electrode dimensions ranging from 4 × 4 to 8 × 8 μm<sup>2</sup>. The electrical characteristics of these devices were measured and modeled by using quantum chemical approaches. These results illustrate alternative routes toward the fabrication of planar 2D devices based on molecular monolayers and carbon electrodes.

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Publication Details

Journal
ACS Applied Electronic Materials
Published
2025-10-14
DOI
https://doi.org/10.1021/acsaelm.5c01566
Primary Topic
Semiconductor materials and devices
Type
article
Field-Weighted Citation Impact
0.00

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article

Molecular Electronics Meets Direct-Write Carbon Nanofabrication via Focused Electron-Beam-Induced Deposition (FEBID): A Platform for Junction Architecture Design

Sara Sangtarash, Soraya Sangiao, Lucía Herrer, J. M. De Teresa et al.
ACS Applied Electronic Materials
Semiconductor materials and devices
article

Molecular Electronics Meets Direct-Write Carbon Nanofabrication via Focused Electron-Beam-Induced Deposition (FEBID): A Platform for Junction Architecture Design

Sara Sangtarash, Soraya Sangiao, Lucía Herrer, J. M. De Teresa, Paul J. Low, Colin J. Lambert, Hatef Sadeghi, Aitor García‐Serrano, Richard John Nichols, Alejandro González-Orive, Santiago Martı́n, Pilar Ce�a
article en

Abstract

The electrical characteristics of a molecular junction are highly sensitive to the nature and uniformity of the molecule|electrode contacts. This gives rise to significant interest in the development of not only the active molecular structures that modulate charge transport and the anchor groups that contact them to the electrodes, but also methods for assembling uniform molecular monolayers on a substrate electrode and subsequent fabrication of a "top electrode" to achieve the reliable fabrication of viable molecular electronic devices. In this contribution, 4-(4-(4-(trimethylsilylethynyl)-phenylethynyl)-phenylethynyl)-aniline was converted to the corresponding diazonium salt and electrografted onto highly oriented pyrolytic graphite (HOPG), resulting in an organized monolayer covalently bonded to the HOPG "substrate" electrode. Subsequently, focused electron-beam-induced deposition was used to form an amorphous carbon top electrode (C-FEBID) onto the monolayer from a naphthalene precursor. By guiding the raster scanning of the electron beam, the position, shape, and thickness of the carbon electrode "written" onto the monolayer can be controlled with nanometer precision. In addition, as a proof-of-principle demonstration of the construction of the interconnects necessary for integration of molecular devices, platinum was deposited precisely on top of the C-FEBID electrodes, using focused-ion-beam-induced deposition of PtMe<sub>3</sub>Cp<sup>Me</sup> (Cp<sup>Me</sup> = η<sup>5</sup>-C<sub>5</sub>H<sub>4</sub>Me) (Pt-FIBID). The HOPG|molecule|C-FEBID|Pt-FIBID "large area" junctions produced in this manner exhibited excellent reproducibility and were free of short circuits for top-electrode dimensions ranging from 4 × 4 to 8 × 8 μm<sup>2</sup>. The electrical characteristics of these devices were measured and modeled by using quantum chemical approaches. These results illustrate alternative routes toward the fabrication of planar 2D devices based on molecular monolayers and carbon electrodes.

ACS Applied Electronic MaterialsVol. 7(20)
University of Liverpool (GB), Universidad de La Laguna (ES), The University of Western Australia (AU), Universidad de Zaragoza (ES), University of Warwick (GB), Instituto de Nanociencia y Materiales de Aragón (ES), Istituto Nazionale per la Fisica della Materia (IT), Lancaster University (GB)
UK Research and Innovation, Ministerio de Economía y Competitividad, Ministerio de Ciencia e Innovación, Universidad de Zaragoza, Engineering and Physical Sciences Research Council, Agencia Estatal de Investigación
Openalex Percentile: Top 71%
Semiconductor materials and devices
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