Methodological Approach to the Characterization of Single-Photon Sources Using a Hanbury Brown–Twiss Interferometer in a Laser-Excited Fluorescence Microscope

The development of quantum-enhanced technologies requires single-photon sources, as well as methods for their characterization and verification. Here, we describe a methodology for measuring the correlation function of a single-photon source using an experimental setup that comprises a laser-excited fluorescence microscope equipped with a Hanbury Brown–Twiss intensity interferometer as one of the detection systems. Measurements of the response function of the device and the reference samples are performed. The second-order autocorrelation function of the exciton state of GaAs quantum dots in AlGaAs nanowires is obtained and reveals a single-photon emission.