Fourier ptychography microscopy with multi-plane adaptive illumination

In this work, we design and implement a novel Fourier Ptychography Microscopy (FPM) system by using multiplane adaptive illumination. The proposed illumination strategy utilizes a series of adaptive beams generated at different planes by using reconfigurable grating patterns, realized with a spatial light modulator, which allows for precise control of illumination angles and patterns in both lateral and axial directions. Such illumination facilitates expanding the numerical aperture of illumination and enables targeted spatial frequency probing. By dynamically adjusting illumination angles across various planes, the system achieves finer resolution and efficiency without increasing the system’s complexity. Both simulation and experimental results validate the enhanced performance of the proposed programmable FPM system in terms of image fidelity, robustness, and adaptability.