Beyond ideal models: non-idealities in TCAD simulations of dielectric-modulated FETs for label-free biosensing
Dielectric modulation in field-effect transistors (FETs) for label-free biosensing have been extensively explored to date, mostly due to the availability of semiconductor device technology computer-aided design (TCAD) tools. Of these works, many reports have revolved around TCAD simulations and focused on ideal or slightly deviated-from-ideal conditions, rather than on the inclusion of non-idealities to create actual biosensing test scenarios. This perspective presents a status of label-free dielectric-modulated biosensing in FETs. It highlights the five most important but rarely used or missing non-idealities in semiconductor TCAD tools, viz., multispecies representation, biomolecular kinematics, cavity profile, hybridization, and transient response. To better align TCAD frameworks with experimental studies, this article recommends adopting method-specific TCAD-integrated modeling (MSTIM) approaches.
Authors
- Rupam Goswami (ORCID: https://orcid.org/0000-0001-8491-2282)
- Raja Vipul Gautam
- Suman Kr. Mitra (ORCID: https://orcid.org/0000-0002-9023-143X)
- Deepjyoti Deb (ORCID: https://orcid.org/0000-0001-9699-7965)
- Prachuryya Subash Das
- H. Choudhury
- Vivek Menon U
Institutions
- University of Modena and Reggio Emilia (IT)
- Tezpur University (IN)
- SRM Institute of Science and Technology (IN)
- Rashtreeya Sikshana Samithi Trust (IN)
Publication Details
- Journal
- Frontiers in Electronics
- Published
- 2025-10-09
- DOI
- https://doi.org/10.3389/felec.2025.1686130
- Primary Topic
- Advancements in Semiconductor Devices and Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00