Advanced And-Inverter Graph Decomposition Technique for Reducing Circuit Complexity
In the field of Electronic Design Automation (EDA), managing circuit complexity is a crucial task for efficient circuit verification, testing, and optimization. Increasing design complexity presents challenges for tasks such as formal verification, fault detection, and circuit optimization. Therefore, reducing circuit complexity becomes crucial in improving the efficiency and scalability of these tasks. These circuits are typically represented as graphs. In the field of parameterized complexity, CutWidth (CW) and TreeWidth (TW) are well-studied decomposition techniques that have been used in analyzing graph algorithms. In this paper, we introduce the TW decomposition technique to the field of EDA for the first time and demonstrate its impact on reducing the circuit complexity of circuits. Additionally, we present a new decomposition technique that combines both decompositions, resulting in a further reduction in circuit complexity. Furthermore, we present experimental results comparing complexity upper bounds from various decompositions to highlight the efficacy of our approach on the ISCAS’85 and EPFL benchmark circuits. Our results show that our decomposition technique outperforms the complexity upper bounds of CW by 90.16× and the complexity upper bounds of TW by 9.34× for the ISCAS’85 benchmarks. Additionally, it outperforms the complexity upper bounds of CW by 1986.37× and the complexity upper bounds of TW by 94.13× for the EPFL benchmarks. Finally, to demonstrate the applicability of the decomposition techniques in solving various EDA problems, we propose a new Formal Verification (FV) approach that leverages these techniques to provide an upper bound for the verification process. We also conduct an experimental evaluation on the ITC’99 , MCNC’91 , and VHDL Library of Arithmetic Units ( ELAU ) benchmark circuits, adder circuits of various sizes (up to 3072-bit width), and Genmul multipliers of different sizes (up to 10×10), to demonstrate the scalability of our approach.
Authors
- Chandan Kumar Jha (ORCID: https://orcid.org/0000-0002-7237-5878)
- Mohamed Nadeem (ORCID: https://orcid.org/0000-0002-0835-1070)
- Rolf Drechsler (ORCID: https://orcid.org/0000-0002-9872-1740)
- L.O. Muller
Institutions
- Hochschule Bremen (DE)
- University of Bremen (DE)
- Cybernet Systems Corporation (Canada) (CA)
Publication Details
- Journal
- ACM Transactions on Design Automation of Electronic Systems
- Published
- 2025-10-10
- DOI
- https://doi.org/10.1145/3771280
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00