C-CIM: A Multi-Mode <u>C</u> onvolution-Capable SRAM- <u>CIM</u>
SRAM is widely used in computing-in-memory (CIM) neural network accelerators because of its relatively mature technology and good compatibility with complementary metal oxide semiconductor logic process. Digital SRAM-CIM is favored by researchers because of its stability and accuracy. However, the current digital SRAM-CIM macro only supports the weight-stationary dataflows, which means the repeated movement of graph data. Some special deep neural network layers, such as depth-wise, make the utilization of computing resources inside CIM low. To overcome these problems, we propose C-CIM, which can switch between input-stationary and weight-stationary dataflows and support matrix multiplication as well as convolution operations with multiple mainstream convolution kernel sizes (1×1, 3×3, 5×5 and 7×7). The C-CIM achieves an average performance of 27.31TOPS/W@8b at a frequency of 1GHz. Experimental results show that our proposed SRAM-CIM successfully outperforms baseline in terms of performance optimization, achieving up to 7.6× performance speedup and up to 86.84% reduction in activation relocation.
Authors
- Bin Liang (ORCID: https://orcid.org/0000-0002-7592-5484)
- 新太郎 中居
- Ruoxian Yang
- Zhaoyan Shen (ORCID: https://orcid.org/0000-0001-9526-6634)
- J. Deng
- Junzhong Shen (ORCID: https://orcid.org/0000-0001-6233-6800)
- Tianyu Wang (ORCID: https://orcid.org/0000-0002-8345-3608)
- Zili Shao (ORCID: https://orcid.org/0000-0002-2173-2847)
- Mei Wen (ORCID: https://orcid.org/0000-0002-5875-3297)
- Yi Wen (ORCID: https://orcid.org/0009-0006-1772-4883)
Institutions
- National Defense University (US)
- Chinese University of Hong Kong (HK)
- Shenzhen University (CN)
- Shandong University of Science and Technology (CN)
Publication Details
- Journal
- ACM Transactions on Design Automation of Electronic Systems
- Published
- 2025-10-10
- DOI
- https://doi.org/10.1145/3769859
- Primary Topic
- Advanced Data Storage Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00