Electron beam co-deposited Bi <sub> 1− <i>x</i> </sub> Te <sub> <i>x</i> </sub>
BiTe-thin films were deposited by electron beam co-evaporation. The influence of the stoichiometry on the Seebeck coefficient, electrical conductivity and the derived power factor is investigated as-deposited as well as after several annealing steps.
Authors
- Jan Dellith (ORCID: https://orcid.org/0009-0008-0930-4437)
- Heike Lorenz (ORCID: https://orcid.org/0000-0001-7608-0092)
- Hans Krüger
- P. Lorenz (ORCID: https://orcid.org/0000-0003-0085-5386)
- Gabriel Zieger (ORCID: https://orcid.org/0000-0002-6194-6559)
Institutions
- Helmholtz Institute Jena (DE)
- Leibniz Institute of Photonic Technology (DE)
Publication Details
- Journal
- Journal of Materials Chemistry C
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d5tc02391b
- Primary Topic
- Advanced Thermoelectric Materials and Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00