Analysis of quantitative classification and properties of X-ray binary systems

X-ray astronomy is a field of research focusing on astronomical objects that emit X-ray radiation. The first interstellar X-ray source, Scorpius X-1, was discovered in 1962. Since then, hundreds of X-ray binaries (XRBs) have been discovered inside the Milky Way, with many unusual properties. These binary systems are currently classified as either high- or low-mass XRBs. However, it is useful to the field to have a classification system consisting of more properties than just mass to have a more descriptive classification of a stellar object. We aimed to analyze the patterns in several variables contributing to an XRB’s properties to find better-fit ways to classify these systems. We hypothesized that there would be a large difference in classes of XRBs across several variables, not just mass, but including the characteristics of a companion star. Utilizing several machine learning algorithms, we analyzed several variables describing an XRB. Dimensionality reduction was used to find correlations between the most important variables defining a star such as temperature, orbital period, metallicity, and redshift, and the classification groups each star falls under. We found that temperature is a quantitative parameter to classify these systems. There are three main groups of temperatures that XRBs fall into. These being stars with a metallicity <-2 and <100000K, those with a metallicity >-2 and <100000K, and those with a metallicity >-2 and >100000K. Characterizing XRBs are important to find star parameters that explain the chemical evolution of the galaxy and understanding of how binary parameters evolve toward detectable mergers.

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Publication Details

Journal
Journal of Emerging Investigators
Published
2025-01-01
DOI
https://doi.org/10.59720/24-090
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
0.00

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article

Analysis of quantitative classification and properties of X-ray binary systems

C.J.G. Garcia, S. Mitra, Devan Kuppusamy, Praveen Rajkumar
Journal of Emerging Investigators
X-ray Diffraction in Crystallography
article

Analysis of quantitative classification and properties of X-ray binary systems

C.J.G. Garcia, S. Mitra, Devan Kuppusamy, Praveen Rajkumar
article en

Abstract

X-ray astronomy is a field of research focusing on astronomical objects that emit X-ray radiation. The first interstellar X-ray source, Scorpius X-1, was discovered in 1962. Since then, hundreds of X-ray binaries (XRBs) have been discovered inside the Milky Way, with many unusual properties. These binary systems are currently classified as either high- or low-mass XRBs. However, it is useful to the field to have a classification system consisting of more properties than just mass to have a more descriptive classification of a stellar object. We aimed to analyze the patterns in several variables contributing to an XRB’s properties to find better-fit ways to classify these systems. We hypothesized that there would be a large difference in classes of XRBs across several variables, not just mass, but including the characteristics of a companion star. Utilizing several machine learning algorithms, we analyzed several variables describing an XRB. Dimensionality reduction was used to find correlations between the most important variables defining a star such as temperature, orbital period, metallicity, and redshift, and the classification groups each star falls under. We found that temperature is a quantitative parameter to classify these systems. There are three main groups of temperatures that XRBs fall into. These being stars with a metallicity <-2 and <100000K, those with a metallicity >-2 and <100000K, and those with a metallicity >-2 and >100000K. Characterizing XRBs are important to find star parameters that explain the chemical evolution of the galaxy and understanding of how binary parameters evolve toward detectable mergers.

Journal of Emerging Investigators
University of Texas at Austin
Openalex Percentile: Top 78%
X-ray Diffraction in Crystallography
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Analysis of quantitative classification and properties of X-ray binary systems — C.J.G. Garcia, S. Mitra, et al. · Journal of Emerging Investigators (2025) | TGRS Research Map | TGRS