Ultrafast Surface Phenomena Studied by Lightwave-driven Scanning Tunneling Microscopy
Lightwave-driven scanning tunneling microscopy (STM) that controls tunneling current by electric field of light has attracted much attention to study ultrafast surface phenomena. We generated broadband mid-infrared pulses and combined them to STM. We achieved fastest temporal resolution of 29 fs in lightwave-driven STM. This technique is expected to be a new way to reveal non-equilibrium electronic states in atomic scale.
Authors
- Yusuke Arashida (ORCID: https://orcid.org/0000-0001-6366-3934)
Institutions
- University of Tsukuba (JP)
Publication Details
- Journal
- Vacuum and Surface Science
- Published
- 2025-10-09
- DOI
- https://doi.org/10.1380/vss.68.560
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00