Investigation of the formation mechanism and control technology of small-sized structure defects in CdZnTe single crystals grown by the VGF method
The optimized VGF crystal growth method can effectively suppress small-size structural defects and prepare high-quality 4-inch full CZT single crystals.
Authors
- Xiaoping Ouyang (ORCID: https://orcid.org/0000-0001-8474-2869)
- Wei Dai (ORCID: https://orcid.org/0000-0001-7097-9881)
- Linyue Liu (ORCID: https://orcid.org/0000-0001-9762-9590)
- Xuchen Wang (ORCID: https://orcid.org/0000-0002-5997-1130)
- Zewen Tan (ORCID: https://orcid.org/0000-0002-2657-6978)
- Jinbin Wang (ORCID: https://orcid.org/0000-0001-5192-7648)
- Zhao Fu (ORCID: https://orcid.org/0009-0003-7889-3523)
- Xiangli Zhong (ORCID: https://orcid.org/0000-0003-1520-3567)
Institutions
- Northwest Institute of Nuclear Technology (CN)
- Xiangtan University (CN)
Publication Details
- Journal
- CrystEngComm
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1039/d5ce00752f
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00