In situ current measurement in a compact broad ion source for helium and other ions

Compact broad beam ion sources with a small area footprint enable widespread applications of irradiation experiments. However, the lack of beam deflection and neutral particle traps for short beamlines poses a challenge to accurate fluence measurements. Here, a solution by measuring the current in a mobile Faraday cup placed close to the edge of a broad ion beam is presented. In combination with sputter experiments this accounts for the beam profile and divergence. To account for the neutralisation due to charge transfer empirical factors are measured and compared with literature data. A comparison to a known ion source yielded a deviation within the limits of uncertainty between the implanted fluence and the fluence measured with the presented method. This proves the reliability of our in situ measurement of ion fluence. • In situ current measurement for multiple ion species in a compact broad ion source. • Measuring current dependent calibration factors and charge exchange cross section. • Validation of fluence by comparison with known sources.

Authors

Institutions

Publication Details

Journal
Vacuum
Published
2025-10-08
DOI
https://doi.org/10.1016/j.vacuum.2025.114781
Citations
1
Primary Topic
Mass Spectrometry Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.76
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

In situ current measurement in a compact broad ion source for helium and other ions

Johannes Kaufmann, Uwe D. Zeitner, Thomas Siefke, Félix Otto
1 citations
Vacuum
Mass Spectrometry Techniques and Applications
0.76
article

In situ current measurement in a compact broad ion source for helium and other ions

Johannes Kaufmann, Uwe D. Zeitner, Thomas Siefke, Félix Otto
article en
1 citations

Abstract

Compact broad beam ion sources with a small area footprint enable widespread applications of irradiation experiments. However, the lack of beam deflection and neutral particle traps for short beamlines poses a challenge to accurate fluence measurements. Here, a solution by measuring the current in a mobile Faraday cup placed close to the edge of a broad ion beam is presented. In combination with sputter experiments this accounts for the beam profile and divergence. To account for the neutralisation due to charge transfer empirical factors are measured and compared with literature data. A comparison to a known ion source yielded a deviation within the limits of uncertainty between the implanted fluence and the fluence measured with the presented method. This proves the reliability of our in situ measurement of ion fluence. • In situ current measurement for multiple ion species in a compact broad ion source. • Measuring current dependent calibration factors and charge exchange cross section. • Validation of fluence by comparison with known sources.

VacuumVol. 243
Helmholtz Institute Jena (DE), Carl Zeiss (Germany) (DE), Fraunhofer Institute for Applied Optics and Precision Engineering (DE), Friedrich Schiller University Jena (DE)
Openalex Percentile: Top 25%
Mass Spectrometry Techniques and Applications
0.76
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.