Microwave magnetometer: Magnetic hysteresis reconstruction via microwave resonance spectroscopy

We present a model-driven framework—termed the microwave magnetometer—for reconstructing magnetic hysteresis loops and quantitatively extracting intrinsic magnetic parameters directly from broadband frequency–field ferromagnetic resonance (FMR) spectra. By analytically inverting the Kittel equation and introducing a hysteresis ratio model, we extract the normalized magnetization curve M(H)/Ms and determine key parameters including the anisotropy field Hk, saturation magnetization Ms, coercivity Hc, and saturation field Hs, using only high-frequency dynamic measurements. This method is experimentally validated on four sputtered thin films—two with uniaxial anisotropy (FeCoB and FeGaB) and two isotropic stripe-domain FeNi samples—through direct comparison with vibrating sample magnetometry (VSM) data. The reconstructed loops show strong agreement with VSM results in easy-axis configurations and retain fidelity even in domain-rich or weakly anisotropic systems. Deviations in low-field, non-saturated regimes are identified and attributed to nonuniform dynamic responses such as domain-wall motion and localized spin-wave excitations. The microwave magnetometer framework offers a contactless, non-invasive alternative to conventional magnetometry and extends the utility of FMR into static characterization, enabling high-resolution hysteresis reconstruction in magnetic films and integrated magnetic devices.

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Publication Details

Journal
Journal of Applied Physics
Published
2025-10-09
DOI
https://doi.org/10.1063/5.0292040
Primary Topic
Magnetic properties of thin films
Type
article
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article

Microwave magnetometer: Magnetic hysteresis reconstruction via microwave resonance spectroscopy

Lining Pan, Derang Cao, Ruoying Wang, Jie Xu et al.
Journal of Applied Physics
Magnetic properties of thin films
article

Microwave magnetometer: Magnetic hysteresis reconstruction via microwave resonance spectroscopy

Lining Pan, Derang Cao, Ruoying Wang, Jie Xu, Mengchen Liu, Chuang Wang, Xiaoyu Wang
article en

Abstract

We present a model-driven framework—termed the microwave magnetometer—for reconstructing magnetic hysteresis loops and quantitatively extracting intrinsic magnetic parameters directly from broadband frequency–field ferromagnetic resonance (FMR) spectra. By analytically inverting the Kittel equation and introducing a hysteresis ratio model, we extract the normalized magnetization curve M(H)/Ms and determine key parameters including the anisotropy field Hk, saturation magnetization Ms, coercivity Hc, and saturation field Hs, using only high-frequency dynamic measurements. This method is experimentally validated on four sputtered thin films—two with uniaxial anisotropy (FeCoB and FeGaB) and two isotropic stripe-domain FeNi samples—through direct comparison with vibrating sample magnetometry (VSM) data. The reconstructed loops show strong agreement with VSM results in easy-axis configurations and retain fidelity even in domain-rich or weakly anisotropic systems. Deviations in low-field, non-saturated regimes are identified and attributed to nonuniform dynamic responses such as domain-wall motion and localized spin-wave excitations. The microwave magnetometer framework offers a contactless, non-invasive alternative to conventional magnetometry and extends the utility of FMR into static characterization, enabling high-resolution hysteresis reconstruction in magnetic films and integrated magnetic devices.

Journal of Applied PhysicsVol. 138(14)
Center for Theoretical Physics (PL), Ningbo Institute of Industrial Technology (CN), Lanzhou University (CN)
Openalex Percentile: Top 77%
Magnetic properties of thin films
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