Realization of a Pre-Sample Photonic-Based Free-Electron Modulator in Ultrafast Transmission Electron Microscopes

Spatial and temporal light modulation is a well-established technology that enables dynamic shaping of the phase and amplitude of optical fields, significantly enhancing the resolution and sensitivity of imaging methods. Translating this capability to electron beams is highly desirable within the framework of a transmission electron microscope (TEM) to benefit from the nanometer spatial resolution of this instrument. In this work, we report on the experimental realization of a photonic-based free-electron modulator integrated into the column of two ultrafast TEMs for presample electron-beam shaping. Electron-photon interaction is employed to coherently modulate both the transverse and longitudinal components of the electron wave function (through lateral phase imprinting and temporal profiling, respectively), while leveraging dynamically controlled optical fields and tailored designs of the electron-laser-sample interaction geometry. Using energy- and momentum-resolved electron detection, we successfully reconstruct the shaped electron wave function at the TEM sample plane. These results demonstrate the ability to manipulate the electron wave function before probing the sample, paving the way for photonics-inspired imaging and spectroscopy techniques in ultrafast electron microscopy.

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Publication Details

Journal
ACS Photonics
Published
2025-10-08
DOI
https://doi.org/10.1021/acsphotonics.5c00549
Citations
1
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
2.55
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article

Realization of a Pre-Sample Photonic-Based Free-Electron Modulator in Ultrafast Transmission Electron Microscopes

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1 citations
ACS Photonics
Advanced Electron Microscopy Techniques and Applications
2.55
article

Realization of a Pre-Sample Photonic-Based Free-Electron Modulator in Ultrafast Transmission Electron Microscopes

Giovanni Maria Vanacore, Ido Kaminer, Dan Masiel, Paolo Rosi, Fabrizio Carbone, Michael Yannai, Beatrice Matilde Ferrari, Raphael Dahan, Vincenzo Grillo, Cameron Duncan, F. Javier Garcı́a de Abajo, Irene Ostroman, Thomas LaGrange, Sang Tae Park, Yuval Adiv, Arthur Niedermayr, Tom Lenkiewicz Abudi, Tal Fishman, Maria Giulia Bravi
article en
1 citations

Abstract

Spatial and temporal light modulation is a well-established technology that enables dynamic shaping of the phase and amplitude of optical fields, significantly enhancing the resolution and sensitivity of imaging methods. Translating this capability to electron beams is highly desirable within the framework of a transmission electron microscope (TEM) to benefit from the nanometer spatial resolution of this instrument. In this work, we report on the experimental realization of a photonic-based free-electron modulator integrated into the column of two ultrafast TEMs for presample electron-beam shaping. Electron-photon interaction is employed to coherently modulate both the transverse and longitudinal components of the electron wave function (through lateral phase imprinting and temporal profiling, respectively), while leveraging dynamically controlled optical fields and tailored designs of the electron-laser-sample interaction geometry. Using energy- and momentum-resolved electron detection, we successfully reconstruct the shaped electron wave function at the TEM sample plane. These results demonstrate the ability to manipulate the electron wave function before probing the sample, paving the way for photonics-inspired imaging and spectroscopy techniques in ultrafast electron microscopy.

ACS PhotonicsVol. 12(11)
Luminex (United States) (US), Institució Catalana de Recerca i Estudis Avançats (ES), JEOL (Japan) (JP), Technion – Israel Institute of Technology (IL), Institute of Photonic Sciences (ES), Shanghai Institute for Science of Science (CN), Istituto Nanoscienze (IT), JEOL (United States) (US), Barcelona Institute of Science and Technology (ES), LumaMed (United States) (US), Lumina (Sweden) (SE), Institute of Science and Technology, École Polytechnique Fédérale de Lausanne (CH), University of Milano-Bicocca (IT)
Openalex Percentile: Top 9%
Advanced Electron Microscopy Techniques and Applications
2.55
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