Knowledge-embedded machine learning for production optimization on logistical delivery grids

Abstract Measurement uncertainty is often treated as noise to be reduced, but in reality, it reflects a mismatch between point-based observations and the underlying stochastic nature of physical processes. In scenarios involving both regression targets and classification-based thresholds, this discrepancy can be systematically exploited for improved optimization. We propose a novel training approach based on a compound loss function that integrates two inputs describing the same target: a metric signal (e.g., a physical measurement) and a categorical estimate (e.g., derived from expert judgment, statistical aggregation, or repeated sampling). This dual-input strategy reflects how individual noisy observations differ from their expected behavior over time and uses this difference to optimize learning under aleatoric uncertainty. The approach is model-agnostic, scalable to multiple targets, and allows for tuning prior knowledge contributions via a weighting parameter. Using synthetic data derived from opto-semiconductor measurements, we demonstrate a +17.78% improvement in delivery conformity under realistic constraints, with only a marginal increase in normalized regression error (ΔMAE = +0.0073). These results highlight the method’s practical applicability and its scalability to complex, multi-target optimization scenarios.

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Publication Details

Journal
The International Journal of Advanced Manufacturing Technology
Published
2025-10-01
DOI
https://doi.org/10.1007/s00170-025-16530-7
Primary Topic
Scheduling and Optimization Algorithms
Type
article
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article

Knowledge-embedded machine learning for production optimization on logistical delivery grids

Christian Heumann, Stefan Michael Stroka
The International Journal of Advanced Manufacturing Technology
Scheduling and Optimization Algorithms
article

Knowledge-embedded machine learning for production optimization on logistical delivery grids

Christian Heumann, Stefan Michael Stroka
article en

Abstract

Abstract Measurement uncertainty is often treated as noise to be reduced, but in reality, it reflects a mismatch between point-based observations and the underlying stochastic nature of physical processes. In scenarios involving both regression targets and classification-based thresholds, this discrepancy can be systematically exploited for improved optimization. We propose a novel training approach based on a compound loss function that integrates two inputs describing the same target: a metric signal (e.g., a physical measurement) and a categorical estimate (e.g., derived from expert judgment, statistical aggregation, or repeated sampling). This dual-input strategy reflects how individual noisy observations differ from their expected behavior over time and uses this difference to optimize learning under aleatoric uncertainty. The approach is model-agnostic, scalable to multiple targets, and allows for tuning prior knowledge contributions via a weighting parameter. Using synthetic data derived from opto-semiconductor measurements, we demonstrate a +17.78% improvement in delivery conformity under realistic constraints, with only a marginal increase in normalized regression error (ΔMAE = +0.0073). These results highlight the method’s practical applicability and its scalability to complex, multi-target optimization scenarios.

The International Journal of Advanced Manufacturing TechnologyVol. 140(11-12)
OSRAM (United States) (US), LMU Klinikum (DE), OSRAM (Germany) (DE), Ludwig-Maximilians-Universität München (DE)
Openalex Percentile: Top 60%
Scheduling and Optimization Algorithms
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