A Two-Stage Turn-On Gate Driver for SiC MOSFET with Short-Circuit Current Suppression
The short-circuit tolerance of silicon carbide MOSFETs (SiC MOSFETs) is relatively limited, leading to increased demands on the response speed and protective capability of short-circuit detection and protection circuits. This paper proposes a two-stage gate drive strategy for suppressing short-circuit currents through the reduction of gate voltage, which effectively limits the development of short-circuit currents before protective measures are initiated. Simulation validation was performed using the 1700V / 310A SiC power module CAS310M17BM3. The results indicate that the proposed drive scheme can reduce short-circuit losses by 73.5\%, shorten the protection response time by 60\%, and also decrease turn-on losses under normal operating conditions.
Authors
- Yong Chen (ORCID: https://orcid.org/0009-0008-0953-5892)
- Yuze Zheng (ORCID: https://orcid.org/0009-0003-5718-8366)
- Yukun Niu
- Xuhui Song
- Fan Zhang (ORCID: https://orcid.org/0000-0003-4184-9564)
- Xiaolu Zhang (ORCID: https://orcid.org/0009-0005-8724-8133)
- Cheng Xu (ORCID: https://orcid.org/0000-0003-4890-2030)
- Kaixiang Gong
Institutions
- China Southern Power Grid (China) (CN)
- Xi'an Jiaotong University (CN)
Publication Details
- Published
- 2025-08-15
- DOI
- https://doi.org/10.1109/wipda-asia63772.2025.11183868
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00