Breaking the Strength-Ductility Paradigm in Metallic Thin Films via Atomic-Scale and Microstructural Engineering

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SPIRE - Sciences Po Institutional REpository
Published
2025-05-20
Primary Topic
Semiconductor materials and devices
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article
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article

Breaking the Strength-Ductility Paradigm in Metallic Thin Films via Atomic-Scale and Microstructural Engineering

Matteo Ghidelli
SPIRE - Sciences Po Institutional REpository
Semiconductor materials and devices
article

Breaking the Strength-Ductility Paradigm in Metallic Thin Films via Atomic-Scale and Microstructural Engineering

Matteo Ghidelli
article en

Abstract

No abstract available for this paper.
SPIRE - Sciences Po Institutional REpository
Université Sorbonne Paris Nord (FR), Laboratoire des Sciences des Procédés et des Matériaux (FR)
Openalex Percentile: Top 73%
Semiconductor materials and devices
OpenAlex
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Breaking the Strength-Ductility Paradigm in Metallic Thin Films via Atomic-Scale and Microstructural Engineering — Matteo Ghidelli · SPIRE - Sciences Po Institutional REpository (2025) | TGRS Research Map | TGRS