Ultralow Lattice Thermal Conductivity and High <i>ZT</i> of n-Type Polycrystalline SnSe Realized by Liquid Phase Sintering
SnSe has drawn increasing attention in thermoelectric applications because of its exceptional n/p-type characteristics. Although recent studies have reported an excellent figure of merit (<i>ZT</i>) value in p-type polycrystalline SnSe, achieving a breakthrough in thermoelectric performance for its n-type counterpart SnSe remains a critical challenge. The presence of V<sub>Sn</sub> imposes a critical constraint on the synergistic optimization of carrier transport and phonon scattering in n-type SnSe. In this study, liquid phase sintering introduces high-density dislocations into n-type SnSe polycrystals, effectively scattering mid-frequency phonons. Huge lattice strain fluctuations caused by the defects enable an ultralow lattice thermal conductivity (0.21 W m<sup>-1</sup> K<sup>-1</sup>) at 793 K. In addition, part of the liquid phase Sn tends to penetrate into the matrix, which leads to a higher carrier concentration and considerable enhancement in electrical properties. Consequently, a superior <i>ZT</i> (~1.9, 793 K) and an outstanding average <i>ZT</i> (<i>ZT</i> <sub>ave</sub>) (~0.72, 300 to 873 K) are achieved in polycrystalline SnSe, which rank at the top level reported for SnSe-based n-type thermoelectric materials, exceeding those of most n-type thermoelectric systems for mid-temperature applications.
Authors
- Bin Su (ORCID: https://orcid.org/0000-0002-5547-8664)
- Hua‐Lu Zhuang (ORCID: https://orcid.org/0000-0002-5648-1187)
- Jincheng Yu (ORCID: https://orcid.org/0000-0002-3490-6965)
- Zhanran Han
- Hezhang Li (ORCID: https://orcid.org/0000-0002-6356-321X)
- Yilin Jiang (ORCID: https://orcid.org/0000-0002-8815-4260)
- Haihua Hu (ORCID: https://orcid.org/0000-0002-2210-8384)
- Yunfeng He (ORCID: https://orcid.org/0000-0001-6810-8630)
- Jingwei Li
- Jing‐Feng Li (ORCID: https://orcid.org/0000-0002-0185-0512)
- Zhengqin Wang
- Lu Chen (ORCID: https://orcid.org/0000-0002-8426-3742)
Institutions
- Tohoku University (JP)
- Fujian Institute of Research on the Structure of Matter (CN)
- Tan Kah Kee Innovation Laboratory (CN)
- Tsinghua University (CN)
Publication Details
- Journal
- Research
- Published
- 2025-01-01
- DOI
- https://doi.org/10.34133/research.0962
- Citations
- 2
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 1.46