The effect of laser radiation on a junction field-effect transistor

Experimental and theoretical studies of the effect of modulated laser radiation on the functioning of a junction field-effect transistor (JFET) as part of an amplifier stage with a common source have been carried out. Patterns in changes in transistor parameters depending on external radiation are determined. It has been established that the cut-off voltage and the specific steepness of the shutter undergo the greatest changes during laser irradiation. It was found that when the transistor structure is irradiated, a photovoltaic effect occurs at the p-n junction of the gate, the concentration of free charge carriers in the semiconductor regions and the channel resistance change. It is shown that the device is sufficiently resistant to laser radiation, which is crucial for creating radiation-resistant integrated circuits.

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Publication Details

Journal
Радиотехника и электроника / Journal of Communications Technology and Electronics
Published
2025-01-01
DOI
https://doi.org/10.7868/s3034590125010092
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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article

The effect of laser radiation on a junction field-effect transistor

С. Ш. Рехвиашвили
Радиотехника и электроника / Journal of Communications Technology and Electronics
Integrated Circuits and Semiconductor Failure Analysis
article

The effect of laser radiation on a junction field-effect transistor

С. Ш. Рехвиашвили
article en

Abstract

Experimental and theoretical studies of the effect of modulated laser radiation on the functioning of a junction field-effect transistor (JFET) as part of an amplifier stage with a common source have been carried out. Patterns in changes in transistor parameters depending on external radiation are determined. It has been established that the cut-off voltage and the specific steepness of the shutter undergo the greatest changes during laser irradiation. It was found that when the transistor structure is irradiated, a photovoltaic effect occurs at the p-n junction of the gate, the concentration of free charge carriers in the semiconductor regions and the channel resistance change. It is shown that the device is sufficiently resistant to laser radiation, which is crucial for creating radiation-resistant integrated circuits.

Радиотехника и электроника / Journal of Communications Technology and ElectronicsVol. 70(1)
Openalex Percentile: Top 73%
Integrated Circuits and Semiconductor Failure Analysis
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