Design, Simulation and Characterization of an Ultrathin Dual-Band Polarization-Insensitive Metamaterial Absorber

This article focuses on the study of a dual-band metamaterial absorber operating within the <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$1-10 \text{GHz}$</tex> frequency range, achieving an absorption rate exceeding 95%. This metamaterial consists of a copper ground plane, an FR-4 dielectric substrate with a thickness of 1.6 mm, and copper metallic patterns etched on its surface. The performance of this metamaterial is evaluated in terms of absorption and polarization conversion rate through parametric analysis. This study also investigates the influence of the incidence and polarization angles (in both TE and TM modes) on the absorption performance of the material. Furthermore, an experimental setup is established to validate the simulations and characterize the metastructure.