Magnetic Circuit Parameter Extraction by Dual Finite Element Formulations

This paper presents dual finite element formulations for extraction of magnetic circuit (MC) parameter in electromagnetic devices. Analogous to electric circuit (EC), lumped parameters in MC, namely magnetic-resistance and magnetic-inductance, can be extracted by dual formulations employing scalar and vector potential variables. The dual formulations used in MC parameter extraction also shows the property of complementary energy bounds. Special treatments are developed to consider the case when the topology of both permeability domain and conductivity domain is nontrivial.

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Publication Details

Journal
IEEE Transactions on Magnetics
Published
2025-01-01
DOI
https://doi.org/10.1109/tmag.2025.3616982
Primary Topic
Non-Destructive Testing Techniques
Type
article
Field-Weighted Citation Impact
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article

Magnetic Circuit Parameter Extraction by Dual Finite Element Formulations

Shuai Yan, Tianyu Zheng, Xiaoyu Xu, Zhuoxiang Ren et al.
IEEE Transactions on Magnetics
Non-Destructive Testing Techniques
article

Magnetic Circuit Parameter Extraction by Dual Finite Element Formulations

Shuai Yan, Tianyu Zheng, Xiaoyu Xu, Zhuoxiang Ren, Yaxing Zhou
article en

Abstract

This paper presents dual finite element formulations for extraction of magnetic circuit (MC) parameter in electromagnetic devices. Analogous to electric circuit (EC), lumped parameters in MC, namely magnetic-resistance and magnetic-inductance, can be extracted by dual formulations employing scalar and vector potential variables. The dual formulations used in MC parameter extraction also shows the property of complementary energy bounds. Special treatments are developed to consider the case when the topology of both permeability domain and conductivity domain is nontrivial.

IEEE Transactions on Magnetics
Chinese Academy of Sciences (CN), Institute of Electrical Engineering (CN)
Openalex Percentile: Top 72%
Non-Destructive Testing Techniques
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