A 9T SRAM Computation-in-Memory Architecture With High-Precision MAC, Enhanced Bitline Voltage Margin, and Improved Frequency Performance Over Conventional Architectures

To address the data-intensive demands of modern artificial intelligence (AI) systems, computation-in-memory (CIM) based on static random-access memory (SRAM) has emerged as a promising solution by integrating computing functionality within memory arrays. However, conventional SRAM CIM architectures face two key limitations: low output resistance in single-transistor transmission paths and voltage instability on charge-sharing bitlines. These limitations collectively degrade computational accuracy to 4–5 LSB-level integral nonlinearity (INL), restricting practical deployment. This work proposes a regulated-cascode 9T SRAM cell that enhances analog computation accuracy using a high-impedance transmission path through a cascode configuration and stabilizing the discharge amount of the bitline from a single cell via active feedback regulation. Implemented in Semiconductor Manufacturing International Corporation (SMIC) 55-nm CMOS technology, the proposed cell demonstrates 1.31LSB INL at 400-mV bitline swing (68.4% improvement versus 4–5 LSB baselines), achieving 66.7% voltage utilization efficiency compared with the conventional 50% limit and 23.04% frequency improvement is achieved compared with the conventional architecture. It also achieves an energy efficiency of 18.47 fJ/bit and a compact area of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.655\times 1.175~\mu $</tex-math> </inline-formula>m, while demonstrating a classification accuracy of 97.7% on the MNIST dataset.

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Publication Details

Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Published
2025-10-03
DOI
https://doi.org/10.1109/tvlsi.2025.3613056
Primary Topic
VLSI and Analog Circuit Testing
Type
article
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article

A 9T SRAM Computation-in-Memory Architecture With High-Precision MAC, Enhanced Bitline Voltage Margin, and Improved Frequency Performance Over Conventional Architectures

Zhiting Lin, Hongbiao Wu
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
VLSI and Analog Circuit Testing
article

A 9T SRAM Computation-in-Memory Architecture With High-Precision MAC, Enhanced Bitline Voltage Margin, and Improved Frequency Performance Over Conventional Architectures

Zhiting Lin, Hongbiao Wu
article en

Abstract

To address the data-intensive demands of modern artificial intelligence (AI) systems, computation-in-memory (CIM) based on static random-access memory (SRAM) has emerged as a promising solution by integrating computing functionality within memory arrays. However, conventional SRAM CIM architectures face two key limitations: low output resistance in single-transistor transmission paths and voltage instability on charge-sharing bitlines. These limitations collectively degrade computational accuracy to 4–5 LSB-level integral nonlinearity (INL), restricting practical deployment. This work proposes a regulated-cascode 9T SRAM cell that enhances analog computation accuracy using a high-impedance transmission path through a cascode configuration and stabilizing the discharge amount of the bitline from a single cell via active feedback regulation. Implemented in Semiconductor Manufacturing International Corporation (SMIC) 55-nm CMOS technology, the proposed cell demonstrates 1.31LSB INL at 400-mV bitline swing (68.4% improvement versus 4–5 LSB baselines), achieving 66.7% voltage utilization efficiency compared with the conventional 50% limit and 23.04% frequency improvement is achieved compared with the conventional architecture. It also achieves an energy efficiency of 18.47 fJ/bit and a compact area of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.655\times 1.175~\mu $</tex-math> </inline-formula>m, while demonstrating a classification accuracy of 97.7% on the MNIST dataset.

IEEE Transactions on Very Large Scale Integration (VLSI) SystemsVol. 34(1)
Anhui University (CN)
Openalex Percentile: Top 70%
VLSI and Analog Circuit Testing
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A 9T SRAM Computation-in-Memory Architecture With High-Precision MAC, Enhanced Bitline Voltage Margin, and Improved Frequency Performance Over Conventional Architectures — Zhiting Lin, Hongbiao Wu · IEEE Transactions on Very Large Scale Integration (VLSI) Systems (2025) | TGRS Research Map | TGRS