Characterizations of sidewall recombination behaviors of AlGaInP red light-emitting diodes with micron-scale mesa size by steam oxidation

We report size and oxidation temperature-dependent performance optimization of sidewall steam oxidation for AlGaInP red micro-light-emitting diodes (µLEDs). Devices with mesa sizes from 100 × 100 μm<sup>2</sup> down to 5 × 5 μm<sup>2</sup> were fabricated. Our results reveal that steam oxidation significantly enhances light output and suppresses nonradiative recombination, with optimal oxidation time decreased with device size. At cryogenic temperatures, the best performance is achieved at even shorter oxidation times, highlighting the need for condition-specific processing. Through the ABC model, we show that sidewall oxidation reduces Shockley-Read-Hall recombination and enhances radiative efficiency, particularly in small devices. This study provides a practical guideline for optimizing sidewall treatment to improve the performance of AlGaInP µLEDs for high-resolution display applications.

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Publication Details

Journal
Optics Express
Published
2025-10-03
DOI
https://doi.org/10.1364/oe.575573
Citations
1
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
1.26
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article

Characterizations of sidewall recombination behaviors of AlGaInP red light-emitting diodes with micron-scale mesa size by steam oxidation

Chengpu Yu, Jian‐Jang Huang, Xiang Li, S. W. K. Yuan
1 citations
Optics Express
GaN-based semiconductor devices and materials
1.26
article

Characterizations of sidewall recombination behaviors of AlGaInP red light-emitting diodes with micron-scale mesa size by steam oxidation

Chengpu Yu, Jian‐Jang Huang, Xiang Li, S. W. K. Yuan
article en
1 citations

Abstract

We report size and oxidation temperature-dependent performance optimization of sidewall steam oxidation for AlGaInP red micro-light-emitting diodes (µLEDs). Devices with mesa sizes from 100 × 100 μm<sup>2</sup> down to 5 × 5 μm<sup>2</sup> were fabricated. Our results reveal that steam oxidation significantly enhances light output and suppresses nonradiative recombination, with optimal oxidation time decreased with device size. At cryogenic temperatures, the best performance is achieved at even shorter oxidation times, highlighting the need for condition-specific processing. Through the ABC model, we show that sidewall oxidation reduces Shockley-Read-Hall recombination and enhances radiative efficiency, particularly in small devices. This study provides a practical guideline for optimizing sidewall treatment to improve the performance of AlGaInP µLEDs for high-resolution display applications.

Optics ExpressVol. 33(21)
National Taiwan University (TW)
Openalex Percentile: Top 17%
GaN-based semiconductor devices and materials
1.26
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