sETNM: <b>S</b> oft- <b>E</b> rror- <b>T</b> olerant <b>N</b> onvolatile <b>M</b> RAM for Space Applications

Static random access memory (SRAM) is widely used for its infinite configurability and high performance. However, magnetic RAM (MRAM) is gaining importance in the industry due to its zero leakage, non-volatility, and high radiation reliability. SRAM is susceptible to radiation-induced soft errors, a problem that MRAM mitigates due to its inherent resistance to such errors. Previously, MRAM has been used in various applications, including data storage, but challenges remained in optimizing its design for radiation resilience. In this paper, we have proposed MRAM structure for radiation applications featuring an advanced sense amplifier and precharge circuit. This new MRAM structure provides enhanced radiation hardening with better performance, making it suitable for critical applications in space and other radiation-prone environments. <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Index Terms:</i> MRAM, MTJ, Soft error, SRAM, STT-MRAM.

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Publication Details

Journal
IEEE Transactions on Nanotechnology
Published
2025-01-01
DOI
https://doi.org/10.1109/tnano.2025.3617228
Primary Topic
Advanced Memory and Neural Computing
Type
article
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article

sETNM: S oft- E rror- T olerant N onvolatile M RAM for Space Applications

Govind Prasad, Sankalp Tattwadarshi Swain
IEEE Transactions on Nanotechnology
Advanced Memory and Neural Computing
article

sETNM: S oft- E rror- T olerant N onvolatile M RAM for Space Applications

Govind Prasad, Sankalp Tattwadarshi Swain
article en

Abstract

Static random access memory (SRAM) is widely used for its infinite configurability and high performance. However, magnetic RAM (MRAM) is gaining importance in the industry due to its zero leakage, non-volatility, and high radiation reliability. SRAM is susceptible to radiation-induced soft errors, a problem that MRAM mitigates due to its inherent resistance to such errors. Previously, MRAM has been used in various applications, including data storage, but challenges remained in optimizing its design for radiation resilience. In this paper, we have proposed MRAM structure for radiation applications featuring an advanced sense amplifier and precharge circuit. This new MRAM structure provides enhanced radiation hardening with better performance, making it suitable for critical applications in space and other radiation-prone environments. <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">Index Terms:</i> MRAM, MTJ, Soft error, SRAM, STT-MRAM.

IEEE Transactions on NanotechnologyVol. 24
Birla Institute of Technology and Science, Pilani (IN)
Openalex Percentile: Top 73%
Advanced Memory and Neural Computing
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sETNM: <b>S</b> oft- <b>E</b> rror- <b>T</b> olerant <b>N</b> onvolatile <b>M</b> RAM for Space Applications — Govind Prasad, Sankalp Tattwadarshi Swain · IEEE Transactions on Nanotechnology (2025) | TGRS Research Map | TGRS