Novel FPGA Technology Mapping for Dual-Output LUTs: Methodology and Application
Dual-output look-up tables (LUTs) are supported by modern commercial Field-Programmable Gate Array (FPGA) architectures. Existing technology mapping usually generates multi-output LUTs by merging single-output LUTs. However, these mapping solutions often fail to fully leverage the multi-output capability. This paper proposes a novel FPGA mapping scheme for multi-output logic units, aiming to improve synthesis performance significantly. By introducing new metrics functions, k-input l-output cut (kl-cut) generation method, and methods to add secondary LUT outputs, the proposed approach enables thorough exploration of the design space. Results show that the proposed dual-output LUT synthesis method achieves 30.2% and 34.7% reduction in LUT usage and depth, respectively, outperforming leading-edge dual-output mapping tools. In addition, the proposed mapping scheme is applied to an emerging field-programmable unit, MCluster, proving compatibility and efficiency on non-LUT logic blocks. For the first time, we perform a system-level design flow to demonstrate the benefit of multi-output LUT at the system level and provide critical insights and design trade-offs.
Authors
- Qilian Liang (ORCID: https://orcid.org/0000-0002-3630-8010)
- Chenyun Pan (ORCID: https://orcid.org/0000-0001-9161-1728)
- Liuting Shang (ORCID: https://orcid.org/0000-0001-8149-8696)
- Sungyong Jung (ORCID: https://orcid.org/0000-0002-0749-0394)
- Sheng Lu (ORCID: https://orcid.org/0009-0001-2570-0690)
Institutions
- South Dakota State University (US)
- The University of Texas at Arlington (US)
Publication Details
- Journal
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tcad.2025.3616069
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00