Influence of boundary conditions on transport in a quantum well

The problem of the electrical conductivity of a conducting channel at the boundary of a heterojunction or in a MD transistor is solved, considering the quantum theory of transfer processes. The thickness of the layer can be comparable to and less than the de Broglie wavelength of the charge carriers. The behavior of charge carriers is described by the quantum Liouville equation. The influence of surface scattering of charge carriers is considered through the Soffer boundary conditions. An expression for the electrical conductivity is obtained and its dependence on the strength of the transverse electric field and the roughness parameter of the boundary of the conducting channel with another semiconductor is analyzed. A comparative analysis of theoretical calculations with experimental data is carried out.

Authors

Publication Details

Journal
Микроэлектроника / Russian Microelectronics
Published
2025-01-01
DOI
https://doi.org/10.7868/s3034548025010047
Primary Topic
Quantum, superfluid, helium dynamics
Type
article
Field-Weighted Citation Impact
0.00
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article

Influence of boundary conditions on transport in a quantum well

D. N. Romanov
Микроэлектроника / Russian Microelectronics
Quantum, superfluid, helium dynamics
article

Influence of boundary conditions on transport in a quantum well

D. N. Romanov
article en

Abstract

The problem of the electrical conductivity of a conducting channel at the boundary of a heterojunction or in a MD transistor is solved, considering the quantum theory of transfer processes. The thickness of the layer can be comparable to and less than the de Broglie wavelength of the charge carriers. The behavior of charge carriers is described by the quantum Liouville equation. The influence of surface scattering of charge carriers is considered through the Soffer boundary conditions. An expression for the electrical conductivity is obtained and its dependence on the strength of the transverse electric field and the roughness parameter of the boundary of the conducting channel with another semiconductor is analyzed. A comparative analysis of theoretical calculations with experimental data is carried out.

Микроэлектроника / Russian MicroelectronicsVol. 54(1)
Openalex Percentile: Top 78%
Quantum, superfluid, helium dynamics
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