Suitability verification of a roughness measurement process using measurement system analysis and the Cdl* capability coefficient
This work evaluates a roughness measurement process through a comparative study of measurement system analysis and the application of the Cdl* capability coefficient, which was developed by the Tolerancing and Metrology Research Group, led by the first author of this article. This research proposes a systematic approach for using the Cdl* coefficient to assess the capability of the measurement processes.
Authors
- Sidney Teylor De Oliveira
- José Eduardo Ferreira de Oliveira
- Felipe Roque de Albuquerque Neto (ORCID: https://orcid.org/0000-0002-7934-4767)
Institutions
- Federal Center for Technological Education Celso Suckow da Fonseca (BR)
- Instituto Federal de Educação, Ciência e Tecnologia de Pernambuco (BR)
Publication Details
- Journal
- ACTA IMEKO
- Published
- 2025-09-25
- DOI
- https://doi.org/10.21014/actaimeko.v14i3.1958
- Primary Topic
- Surface Roughness and Optical Measurements
- Type
- article
- Field-Weighted Citation Impact
- 0.00