Complex Error Measurement and its Validation Method by Equivalent Circuit Parameters Measurement for Wideband Resistive Voltage Dividers

Resistive voltage dividers (RVDs) have a wide range of use in volage measurements. It is due to their simple structures and applications under both DC and AC conditions. We have been developing a highly accurate and wideband RVD and its error measurement method from industrial frequencies to MHz ranges. In this paper, complex errors could be measured by the method up to 100 kHz. To confirm that the result is valid, a new validation method has been proposed where accurate equivalent circuit parameters can be measured, and a valid complex error can be determined. Also, we discussed the problem that avoids an accuracy degradation of the parameters through a comparison between the measured error result and the calculated result by the proposed validation method.

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Publication Details

Journal
IEEJ Transactions on Fundamentals and Materials
Published
2025-09-30
DOI
https://doi.org/10.1541/ieejfms.145.301
Primary Topic
Sensor Technology and Measurement Systems
Type
article
Field-Weighted Citation Impact
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article

Complex Error Measurement and its Validation Method by Equivalent Circuit Parameters Measurement for Wideband Resistive Voltage Dividers

Katsuya Tachibana, Toshiaki Shioda, T. Yamada
IEEJ Transactions on Fundamentals and Materials
Sensor Technology and Measurement Systems
article

Complex Error Measurement and its Validation Method by Equivalent Circuit Parameters Measurement for Wideband Resistive Voltage Dividers

Katsuya Tachibana, Toshiaki Shioda, T. Yamada
article en

Abstract

Resistive voltage dividers (RVDs) have a wide range of use in volage measurements. It is due to their simple structures and applications under both DC and AC conditions. We have been developing a highly accurate and wideband RVD and its error measurement method from industrial frequencies to MHz ranges. In this paper, complex errors could be measured by the method up to 100 kHz. To confirm that the result is valid, a new validation method has been proposed where accurate equivalent circuit parameters can be measured, and a valid complex error can be determined. Also, we discussed the problem that avoids an accuracy degradation of the parameters through a comparison between the measured error result and the calculated result by the proposed validation method.

IEEJ Transactions on Fundamentals and MaterialsVol. 145(10)
National Institute of Advanced Industrial Science and Technology (JP), Yokogawa Electric (Japan) (JP)
Openalex Percentile: Top 69%
Sensor Technology and Measurement Systems
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