No Time for Surface Charge: How Bulk Conductivity Hides Charge Patterns from Kelvin Probe Force Microscopy in Contact-Electrified Surfaces

Kelvin probe force microscopy (KPFM) is widely used in stationary and dynamic studies of contact electrification. An obvious question that connects these two has been overlooked: when are charge dynamics too fast for stationary studies to be meaningful? Using a rapid transfer system to quickly perform KPFM after contact, we find the dynamics are too fast in all but the best insulators. Our data further suggest that dynamics are caused by bulk as opposed to surface conductivity, and that charge-transfer heterogeneity is less prevalent than previously suggested.

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Publication Details

Journal
Physical Review Letters
Published
2025-09-30
DOI
https://doi.org/10.1103/lcsm-xxty
Citations
1
Primary Topic
Force Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
1.25
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article

No Time for Surface Charge: How Bulk Conductivity Hides Charge Patterns from Kelvin Probe Force Microscopy in Contact-Electrified Surfaces

Tobias Cramer, Scott Waitukaitis, Felix Pertl, Isaac C. D. Lenton
1 citations
Physical Review Letters
Force Microscopy Techniques and Applications
1.25
article

No Time for Surface Charge: How Bulk Conductivity Hides Charge Patterns from Kelvin Probe Force Microscopy in Contact-Electrified Surfaces

Tobias Cramer, Scott Waitukaitis, Felix Pertl, Isaac C. D. Lenton
article en
1 citations

Abstract

Kelvin probe force microscopy (KPFM) is widely used in stationary and dynamic studies of contact electrification. An obvious question that connects these two has been overlooked: when are charge dynamics too fast for stationary studies to be meaningful? Using a rapid transfer system to quickly perform KPFM after contact, we find the dynamics are too fast in all but the best insulators. Our data further suggest that dynamics are caused by bulk as opposed to surface conductivity, and that charge-transfer heterogeneity is less prevalent than previously suggested.

Physical Review LettersVol. 135(14)
Institute of Science and Technology Austria (AT), University of Bologna (IT)
Openalex Percentile: Top 17%
Force Microscopy Techniques and Applications
1.25
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