Unsupervised Detection of Surface Defects in Varistors with Reconstructed Normal Distribution Under Mask Constraints
Surface defect detection serves as one of the crucial auxiliary components in the quality control of varistors, and it faces real challenges such as the scarcity of defect samples, high labelling cost, and insufficient a priori knowledge, which makes unsupervised deep learning-based detection methods attract attention. However, existing unsupervised models have problems such as inaccurate defect localisation and a low recognition rate of subtle defects in the detection results. To solve the above problems, an unsupervised detection method (Var-MNDR) is proposed to reconstruct the normal distribution of surface defects of varistors under mask constraints. Firstly, on the basis of colour space as well as morphology, an image preprocessing method is proposed to extract the main body image of the varistor, and a mask-constrained main body pseudo-anomaly generation strategy is adopted so that the model focuses on the texture distribution of the main body region of the image, reduces the model’s focus on the background region, and improves the defect localisation capability of the model. Secondly, Kolmogorov–Arnold Networks (KANs) are combined with the U-Network (U-Net) to construct a segmentation sub-network, and the Gaussian radial basis function is introduced as the learnable activation function of the KAN to improve the model’s ability to express the image features, so as to realise more accurate defect detection. Finally, by comparing the four unsupervised defect detection methods, the experimental results prove the superiority and generalisation of the proposed method.
Authors
- Tang Shancheng (ORCID: https://orcid.org/0009-0000-8458-9657)
- Heng Li (ORCID: https://orcid.org/0009-0000-9608-7419)
- Xianyang Xu
- Tong Zhou (ORCID: https://orcid.org/0000-0002-7063-0353)
Institutions
- Xi'an University of Science and Technology (CN)
Publication Details
- Journal
- Applied Sciences
- Published
- 2025-09-27
- DOI
- https://doi.org/10.3390/app151910479
- Citations
- 2
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 2.48
Funders
- National Key Research and Development Program of China