Crystalline Phase-Dependent Emissivity of MoSi2 Nanomembranes for Extreme Ultraviolet Pellicle Applications

Extreme ultraviolet (EUV) pellicles must withstand intense thermal stress during exposure due to their limited heat dissipation, which results from their ultrathin geometry and the vacuum environment within EUV scanners. To address this challenge, we investigated the crystalline phase-dependent emissivity of nanometer-thick molybdenum disilicide (MoSi<sub>2</sub>) membranes. Membranes exhibiting amorphous, hexagonal, and tetragonal phases were independently prepared via controlled annealing, and their thermal radiation properties were evaluated using heat-load testing under emulated EUV scanner conditions. The Hall effect measurements revealed distinct variations in carrier density and mobility across phases, which were theoretically correlated with emissivity using the Lorentz-Drude model. The results demonstrate that emissivity increases in the hexagonal phase due to increased carrier density and reduced scattering, offering improved thermal radiation performance. These findings establish the phase engineering of conductive silicides as a viable strategy for enhancing radiative cooling in EUV pellicles and offer a theoretical framework applicable to other high-temperature nanomaterials.

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Publication Details

Journal
Nanomaterials
Published
2025-09-29
DOI
https://doi.org/10.3390/nano15191488
Citations
1
Primary Topic
Thin-Film Transistor Technologies
Type
article
Field-Weighted Citation Impact
0.73

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article

Crystalline Phase-Dependent Emissivity of MoSi2 Nanomembranes for Extreme Ultraviolet Pellicle Applications

Ha‐Neul Kim, Tae‐Ho Lee, Jung-Yeon Kim, Jinho Ahn et al.
1 citations
Nanomaterials
Thin-Film Transistor Technologies
0.73
article

Crystalline Phase-Dependent Emissivity of MoSi2 Nanomembranes for Extreme Ultraviolet Pellicle Applications

Ha‐Neul Kim, Tae‐Ho Lee, Jung-Yeon Kim, Jinho Ahn, Young Woo Kang
article en
1 citations

Abstract

Extreme ultraviolet (EUV) pellicles must withstand intense thermal stress during exposure due to their limited heat dissipation, which results from their ultrathin geometry and the vacuum environment within EUV scanners. To address this challenge, we investigated the crystalline phase-dependent emissivity of nanometer-thick molybdenum disilicide (MoSi<sub>2</sub>) membranes. Membranes exhibiting amorphous, hexagonal, and tetragonal phases were independently prepared via controlled annealing, and their thermal radiation properties were evaluated using heat-load testing under emulated EUV scanner conditions. The Hall effect measurements revealed distinct variations in carrier density and mobility across phases, which were theoretically correlated with emissivity using the Lorentz-Drude model. The results demonstrate that emissivity increases in the hexagonal phase due to increased carrier density and reduced scattering, offering improved thermal radiation performance. These findings establish the phase engineering of conductive silicides as a viable strategy for enhancing radiative cooling in EUV pellicles and offer a theoretical framework applicable to other high-temperature nanomaterials.

NanomaterialsVol. 15(19)
Hanyang University Medical Center (KR), Hanyang University (KR)
National Research Foundation, Korea Basic Science Institute, National Research Foundation of Korea, Ministry of Science and ICT, South Korea
Openalex Percentile: Top 23%
Thin-Film Transistor Technologies
0.73
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