Image Super-Resolution Reconstruction Network Based on Structural Reparameterization and Feature Reuse
In the task of integrated circuit micrograph acquisition, image super-resolution reconstruction technology can significantly enhance acquisition efficiency. With the advancement of deep learning techniques, the performance of image super-resolution reconstruction networks has improved markedly, but their demand for inference device memory has also increased substantially, greatly limiting their practical application in engineering and deployment on resource-constrained devices. Against this backdrop, we designed image super-resolution reconstruction networks based on feature reuse and structural reparameterization techniques, ensuring that the networks maintain reconstruction performance while being more suitable for deployment in resource-limited environments. Traditional image super-resolution reconstruction networks often redundantly compute similar features through standard convolution operations, leading to significant computational resource wastage. By employing low-cost operations, we replaced some redundant features with those generated from the inherent characteristics of the image and designed a reparameterization layer using structural reparameterization techniques. Building upon local feature fusion and local residual learning, we developed two efficient deep feature extraction modules, and forming the image super-resolution reconstruction networks. Compared to performance-oriented image super-resolution reconstruction networks (e.g., DRCT), our network reduces algorithm parameters by 84.5% and shortens inference time by 49.8%. In comparison with lightweight image reconstruction algorithms, our method improves the mean structural similarity index by 3.24%. Experimental results demonstrate that the image super-resolution reconstruction network based on feature reuse and structural reparameterization achieves an excellent balance between network performance and complexity.
Authors
- Xiaoshi Jin (ORCID: https://orcid.org/0000-0003-0476-7527)
- Tianyu Li (ORCID: https://orcid.org/0009-0006-4797-7144)
- Qiang Liu (ORCID: https://orcid.org/0000-0002-3705-3822)
- Xi Liu (ORCID: https://orcid.org/0009-0000-7903-3953)
Institutions
- Shenyang University of Technology (CN)
Publication Details
- Journal
- Sensors
- Published
- 2025-09-27
- DOI
- https://doi.org/10.3390/s25195989
- Primary Topic
- Advanced Image Processing Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00