An Identify-Then-Eliminate-Based Pixel Correspondence Establishment Method for Fringe Projection Profilometry Against Interreflection
Widely applied fringe projection profilometry faces significant challenges when measuring objects with strong inter-reflections. The existence of inter-reflections results in the overlap of same-frequency fringes, which severely affects the establishment of the pixel correspondence. Existing methods typically quantify inter-reflection errors pixel by pixel, which is unnecessary for pixels free from inter-reflections. In this paper, an identify-then-eliminate based method to establish pixel correspondence is proposed against surface inter-reflections. Different from current methods, it first identifies severely affected pixels and then eliminates inter-reflection errors in a targeted manner. Specifically, in pixel identification stage, dual-frequency phase-shifting method is utilized and an error model is constructed to accurately identify pixels with notable inter-reflection errors. Then in error elimination stage, reverse-sequence frequency-phase joint encoding patterns are designed to facilitate the separation of inter-reflections. A single-pixel encoding neural network is proposed to obtain accurate pixel correspondence with captured two-stage data. Experiments on industrial parts with strong surface inter-reflections illustrates that compared to existing methods, our method obtains high-precision, continuous, and realistic point cloud data. Additionally, our method also maintains the efficiency of measuring objects with strong inter-reflections.
Authors
- Jianrong Tan (ORCID: https://orcid.org/0000-0002-7425-341X)
- Guodong Sa (ORCID: https://orcid.org/0000-0001-7803-2270)
- Zhenyu Liu (ORCID: https://orcid.org/0000-0003-2463-4553)
- Peng Tang
Institutions
- Ningbo University (CN)
- University of Nottingham Ningbo China (CN)
- State Key Laboratory of Chemical Engineering (CN)
- Zhejiang University (CN)
Publication Details
- Journal
- IEEE Transactions on Instrumentation and Measurement
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/tim.2025.3613901
- Primary Topic
- Optical measurement and interference techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00