Thermal Diffusivity Imaging of CFRP: Spatial Correlation Between Lock-In Thermography-Based Measurement and Synchrotron X-Ray CT Simulation on Identical Region
With the increasing adoption of wide-bandgap semiconductors such as SiC and GaN in high-power electronics, the thermal management of semiconductor devices has become critical [...]
Authors
- Ryohei Fujita (ORCID: https://orcid.org/0000-0001-6807-2412)
- Hosei Nagano
- Song Boxi
Institutions
- Nagoya University (JP)
Publication Details
- Published
- 2025-09-12
- DOI
- https://doi.org/10.3390/proceedings2025129057
- Primary Topic
- Thermal properties of materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00