Dynamic Response Analysis of a Functionally Graded Irregular Piezoelectric-Orthotropic Material Substrate Due to a Moving Line Load

Piezoelectric materials hold the key to revolutionizing modern technology, from ultra-sensitive medical devices to energy-efficient sensors, by harnessing their unique directional properties to transform mechanical stresses into precise electrical responses and vice versa. This research deals with the establishment of closed-form mathematical expressions for the induced Horizontal Normal Compressive Stress (HNCS), Tensile Shear Stress (TSS), Vertical Normal Compressive Stress (VNCS), Horizontal Electrical Displacement (HED), and Vertical Electrical Displacement (VED) on a Functionally Graded Irregular Piezoelectric-Orthotropic Material Substrate (FGIPOMS) due to a line load moving with constant velocity. In the scope of the current model, the influence of several physical and geophysical parameters such as Irregularity Depth (ID), Functionally Graded Parameter (FGP), Irregularity Factor (IF), Velocity of Moving Load (VML), and Frictional Coefficient (FC) has been explored comprehensively. Furthermore, the study employed a framework to compare FGIPOMS with an Irregular Piezoelectric Transversely Isotropic Material Substrate (IPTIMS), Irregular Isotropic Material Substrate (IIMS), and Isotropic Material Substrate (IMS) without irregularity. This analysis enhances analogical reasoning, and the derived outcomes have been rigorously validated against pre-established results. The computational analysis incorporated the material properties of PVDF, AIN, and the isotropic substrate. The outcomes were interpreted using MATLAB-generated visualizations, yielding critical insights into the system’s behavior.